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Trap-Assisted Charge Storage in Titania Nanocrystals toward Optoelectronic Nonvolatile Memory.
Sun, Zhenhua; Li, Jinhua; Liu, Chenmin; Yang, Shihe; Yan, Feng.
Afiliação
  • Sun Z; Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China.
  • Li J; Department of Applied Physics, Hong Kong Polytechnic University, Kowloon, Hong Kong, China.
  • Liu C; Department of Applied Physics, Hong Kong Polytechnic University, Kowloon, Hong Kong, China.
  • Yang S; Nano and Advanced Materials Institute Limited, No. 8 Science Park West Avenue, Hong Kong Science Park, New Territories, Hong Kong, China.
  • Yan F; Department of Chemistry, William Mong Institute of Nano Science and Technology, The Hong Kong University of Science and Technology, Clear Water Bay, Kowloon, Hong Kong, China.
Nano Lett ; 21(1): 723-730, 2021 Jan 13.
Article em En | MEDLINE | ID: mdl-33373246
Transistor-based memories are of particular significance in the pursuit of next-generation nonvolatile memories. The charge storage medium in a transistor-based memory is pivotal to the device performance. In this report, nitrogen doping titania nanocrystals (N-TiO2 NCs) synthesized through a low-temperature nonhydrolytic method are used as the charge storage medium in a graphene transistor-based memory. The decoration of the N-TiO2 NCs enables the device to perform as an ultraviolet (UV) light-programmable nonvolatile optoelectronic memory. Multilevel nonvolatile information recording can be realized through accurate control of the incident light dose, which is ascribed to the vast and firm hole trapping abilities of the N-TiO2 NCs induced by the N dopant. Accordingly, a positive gate voltage can be used to erase the programmed state by promoting the recombination of stored holes in N-TiO2 NCs. This study manifests the importance of trap engineering for information storage and provides an alternative path toward nonvolatile optoelectronic memory.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nano Lett Ano de publicação: 2021 Tipo de documento: Article País de afiliação: China