Spectral monitoring at SwissFEL using a high-resolution on-line hard X-ray single-shot spectrometer.

David, Christian; Seniutinas, Gediminas; Makita, Mikako; Rösner, Benedikt; Rehanek, Jens; Karvinen, Petri; Löhl, Florian; Abela, Rafael; Patthey, Luc; Juranic, Pavle

David, Christian; Seniutinas, Gediminas; Makita, Mikako; Rösner, Benedikt; Rehanek, Jens; Karvinen, Petri; Löhl, Florian; Abela, Rafael; Patthey, Luc; Juranic, Pavle.

Afiliação

David C; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Seniutinas G; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Makita M; European XFEL GmbH, Holzkoppel 4, 22869 Schenefeld, Germany.
Rösner B; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Rehanek J; Advanced Accelerator Technologies AG, 5234 Villigen, Switzerland.
Karvinen P; Institute of Photonics, University of Eastern Finland (UEF), FI-80100 Joensuu, Finland.
Löhl F; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Abela R; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Patthey L; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.
Juranic P; Paul Scherrer Institut, Forschungsstrasse 111, 5232 Villigen, Switzerland.

J Synchrotron Radiat ; 28(Pt 6): 1978-1984, 2021 Nov 01.

Article em En | MEDLINE | ID: mdl-34738953

Palavras-chave

X-ray spectrometer; free-electron laser; spectroscopy

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: J Synchrotron Radiat Assunto da revista: RADIOLOGIA Ano de publicação: 2021 Tipo de documento: Article País de afiliação: Suíça

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