Investigations on Practical Issues in Solid Immersion Lens Based Sub-Wavelength Terahertz Imaging Technique: System Stability Verification and Interference Pattern Removal.

Choi, Da-Hye; Shin, Jun-Hwan; Lee, Il-Min; Park, Kyung Hyun

Choi, Da-Hye; Shin, Jun-Hwan; Lee, Il-Min; Park, Kyung Hyun.

Afiliação

Choi DH; Terahertz Research Section, Electronics and Telecommunications Research Institute, Daejeon 34129, Korea.
Shin JH; Terahertz Research Section, Electronics and Telecommunications Research Institute, Daejeon 34129, Korea.
Lee IM; Terahertz Research Section, Electronics and Telecommunications Research Institute, Daejeon 34129, Korea.
Park KH; Terahertz Research Section, Electronics and Telecommunications Research Institute, Daejeon 34129, Korea.

Sensors (Basel) ; 21(21)2021 Oct 21.

Article em En | MEDLINE | ID: mdl-34770295

Palavras-chave

contact-free measurement; interference pattern removal; non-destructive testing; sub-wavelength imaging; terahertz

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2021 Tipo de documento: Article

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2021 Tipo de documento: Article