Probing interlayer shear thermal deformation in atomically-thin van der Waals layered materials.

Zhang, Le; Wang, Han; Zong, Xinrong; Zhou, Yongheng; Wang, Taihong; Wang, Lin; Chen, Xiaolong

Zhang, Le; Wang, Han; Zong, Xinrong; Zhou, Yongheng; Wang, Taihong; Wang, Lin; Chen, Xiaolong.

Afiliação

Zhang L; Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, 518055, Shenzhen, P.R. China.
Wang H; Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, 518055, Shenzhen, P.R. China.
Zong X; Key Laboratory of Flexible Electronics (KLOFE) & Institute of Advanced Materials (IAM), Nanjing Tech University (Nanjing Tech), 30 South Puzhu Road, 211816, Nanjing, P.R. China.
Zhou Y; Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, 518055, Shenzhen, P.R. China.
Wang T; Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, 518055, Shenzhen, P.R. China.
Wang L; Key Laboratory of Flexible Electronics (KLOFE) & Institute of Advanced Materials (IAM), Nanjing Tech University (Nanjing Tech), 30 South Puzhu Road, 211816, Nanjing, P.R. China. iamlwang@njtech.edu.cn.
Chen X; Department of Electrical and Electronic Engineering, Southern University of Science and Technology, 1088 Xueyuan Avenue, 518055, Shenzhen, P.R. China. chenxl@sustech.edu.cn.

Nat Commun ; 13(1): 3996, 2022 Jul 09.

Article em En | MEDLINE | ID: mdl-35810154

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Nat Commun Assunto da revista: BIOLOGIA / CIENCIA Ano de publicação: 2022 Tipo de documento: Article

Texto completo

Imprimir

XML

PubMed Links

Buscar no Google