Gate-tunable negative refraction of mid-infrared polaritons.

Hu, Hai; Chen, Na; Teng, Hanchao; Yu, Renwen; Xue, Mengfei; Chen, Ke; Xiao, Yuchuan; Qu, Yunpeng; Hu, Debo; Chen, Jianing; Sun, Zhipei; Li, Peining; de Abajo, F Javier García; Dai, Qing

Hu, Hai; Chen, Na; Teng, Hanchao; Yu, Renwen; Xue, Mengfei; Chen, Ke; Xiao, Yuchuan; Qu, Yunpeng; Hu, Debo; Chen, Jianing; Sun, Zhipei; Li, Peining; de Abajo, F Javier García; Dai, Qing.

Afiliação

Hu H; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
Chen N; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
Teng H; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
Yu R; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
Xue M; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
Chen K; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
Xiao Y; Department of Electrical Engineering, Ginzton Laboratory, Stanford University, Stanford, CA, USA.
Qu Y; The Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing, China.
Hu D; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
Chen J; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
Sun Z; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
Li P; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.
de Abajo FJG; CAS Key Laboratory of Nanophotonic Materials and Devices, CAS Key Laboratory of Standardization and Measurement for Nanotechnology, CAS Center for Excellence in Nanoscience, National Center for Nanoscience and Technology, Beijing 100190, China.
Dai Q; Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China.

Science ; 379(6632): 558-561, 2023 Feb 10.

Article em En | MEDLINE | ID: mdl-36758071

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Science Ano de publicação: 2023 Tipo de documento: Article País de afiliação: China

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