RESUMEN
To enhance contact resonance atomic force microscopy (CR-AFM) and harmonic AFM imaging simultaneously, we design a multifunctional cantilever. Precise tailoring of the cantilever's dynamic properties is realized by either mass-removing or mass-adding. As prototypes, focused ion beam drilling or depositing is used to fabricate the optimized structures. CR-AFM subsurface imaging on circular cavities covered by a piece of highly oriented pyrolytic graphite validates the improved CR frequency to contact stiffness sensitivity. The detectable subsurface depth and cavity radius increase accordingly by using the multifunctional cantilever. At the same time, the free resonance frequency of the second mode is tuned to an integer multiple of the fundamental one. Harmonic AFM imaging on polystyrene and low-density polystyrene mixture shows the improved harmonic amplitude contrast and signal strength on the two material phases. The multifunctional cantilever can be extended to enhance other similar AFM operation modes and it has potential applications in relevant fields such as mechanical characterization and subsurface imaging.
RESUMEN
In this Letter, we demonstrate a laser fabrication strategy that uses the long focal depth femtosecond axilens laser beam to manufacture the high-aspect-ratio (HAR) micropillars and atomic force microscopy (AFM) probes by one-step exposure. The long depth of focus is generated by modulating laser beam focused at different positions. By adjusting the exposure height, the morphology of HAR micropillars can be tuned flexibly, and the micropillar with an ultra-high aspect ratio (diameter of 1.5 µm, height of 102 µm, ${\rm AR}={70}$AR=70) can be fabricated within 10 ms which is a great challenge for other processing methods to obtain such a HAR microstructure in such a short time. In addition, the HAR micropillar is fabricated onto a cantilever to form the AFM probe. The homemade probe shows fine imaging quality. This method greatly improves the processing efficiency while ensuring the fabrication resolution which provides a powerful method for processing HAR microstructures.
RESUMEN
Several subsurface imaging methods based on atomic force microscopy (AFM) linear nanomechanical mapping, namely contact resonance (CR), bimodal and harmonic AFMs, are investigated and compared. Their respective subsurface detection capability is estimated and evaluated on a model specimen, which is prepared by embedding SiO2 microparticles in a PDMS elastomer. The measured CR frequency, bimodal and harmonic amplitudes are related to local mechanical properties by analyzing cantilever dynamics and further linked to subsurface depths of the particles by finite element analysis. The maximum detectable depths are obtained from the apparent particle diameters in subsurface image channels via employing a simple geometrical model. Under common experimental settings, results demonstrate that the depth limits reach up to about 812â¯nm, 212â¯nm and 127â¯nm for CR, bimodal and harmonic AFM modes, respectively. The depth sensitivity can be tuned and optimized by using either different cantilever eigenmodes in CR-AFM or spectroscopy analysis in bimodal and harmonic AFMs. The three imaging methods have their own suitable application situations. The comparisons can advance a further step into understanding the subsurface image contrast via AFM mechanical sensing.
RESUMEN
We proposed the integration of metasurfaces on atomic force microscopy (AFM) cantilevers to improve the optical lever sensitivity. The metasurface positioned at the back of an AFM cantilever enables anomalous reflection of the laser beam and provides a nonlinear relationship between the incidence and reflection angles following the generalized Snell's law. Therefore, the displacement of the reflected laser spot at the photodetector can be amplified. The metasurface was composed of 30 nm thick Au nano-discs with different diameters in an array of 1500 nm × 300 nm super cells. Using the fabricated metasurface mounted on a precise angle dial and a macroscale cantilever as prototypes, the concept of a metasurface-enhanced cantilever was experimentally ascertained. Results proved that the optical lever sensitivity can be easily increased. Finite element analysis showed that integration of the thin metasurface does not have a significant impact on the cantilever's mechanical properties including stiffness and eigenfrequencies. The proposed metasurface-enhanced optical lever sensitivity may have potential applications in improving functional performances of AFM instruments and cantilever-based sensors, such as allowing much smaller imaging forces and boosting the signal-to-noise ratio.
