RESUMEN
This paper presents an ultra-low-power voltage reference designed in 180 nm CMOS technology. To achieve near-zero line sensitivity, a two-transistor (2-T) voltage reference is biased with a current source to cancel the drain-induced barrier-lowering (DIBL) effect of the 2-T core, thus improving the line sensitivity. This compensation circuit achieves a Monte-Carlo-simulated line sensitivity of 0.035 %/V in a supply range of 0.6 to 1.8 V, while generating a reference voltage of 307.8 mV, with 21.4 pW power consumption. The simulated power supply rejection ratio (PSRR) is -54 dB at 100 Hz. It also achieves a temperature coefficient of 24.8 ppm/°C in a temperature range of -20 to 80 °C, with a projected area of 0.003 mm2.
RESUMEN
This paper presents an amplifier-less and digital-intensive current-to-digital converter for ion-sensitive FET sensors. Capacitance on the input node is utilized as a residue accumulator, and a clocked comparator is followed for quantization. Without any continuous-time feedback circuit, the converter performs a first-order noise shaping of the quantization error. In order to minimize static power consumption, the proposed circuit employs a single-ended current-steering digital-to-analog converter which flows only the same current as the input. By adopting a switching noise averaging algorithm, our dynamic element matching not only mitigates mismatch of current sources in the current-steering DAC, but also makes the effect of dynamic switching noise become an input-independent constant. The implemented circuit in 0.35 µm CMOS converts the current input with a range of 2.8 µ A to 15 b digital output in about 4 ms, showing a DNL of +0.24/-0.25 LSB and an INL of + 1.98/-1.98 LSB while consuming 16.8 µW.
