RESUMEN
Polarization-sensitive photodetection has attracted considerable attention as an emerging technology for future optoelectronic applications such as three-dimensional (3D) imaging, quantum optics, and encryption. However, traditional photodetectors based on Si or III-V InGaAs semiconductors cannot directly detect polarized light without additional optical components. Herein, we demonstrate a self-powered linear-polarization-sensitive near-infrared (NIR) photodetector using a two-dimensional WSe2/ReSe2 van der Waals heterostructure. The WSe2/ReSe2 heterojunction photodiode with semivertical geometry exhibits excellent performance: an ideality factor of 1.67, a broad spectral photoresponse of 405-980 nm with a significant photovoltaic effect, outstanding linearity with a linear dynamic range wider than 100 dB, and rapid photoswitching behavior with a cutoff frequency up to 100 kHz. Strongly polarized excitonic transitions around the band edge in ReSe2 lead to significant 980 nm NIR linear-polarization-dependent photocurrent. This linear polarization sensitivity remains stable even after exposure to air for longer than five months. Furthermore, by leveraging the NIR (980 nm)-selective linear polarization detection of this photodiode under photovoltaic operation, we demonstrate digital incoherent holographic 3D imaging.
RESUMEN
Electronic skins (e-skins)-electronic sensors mechanically compliant to human skin-have long been developed as an ideal electronic platform for noninvasive human health monitoring. For reliable physical health monitoring, the interface between the e-skin and human skin must be conformal and intact consistently. However, conventional e-skins cannot perfectly permeate sweat in normal day-to-day activities, resulting in degradation of the intimate interface over time and impeding stable physical sensing. Here, we present a sweat pore-inspired perforated e-skin that can effectively suppress sweat accumulation and allow inorganic sensors to obtain physical health information without malfunctioning. The auxetic dumbbell through-hole patterns in perforated e-skins lead to synergistic effects on physical properties including mechanical reliability, conformability, areal mass density, and adhesion to the skin. The perforated e-skin allows one to laminate onto the skin with consistent homeostasis, enabling multiple inorganic sensors on the skin to reliably monitor the wearer's health over a period of weeks.
RESUMEN
In this work, the work function variation (WFV) and global variability (GV) sources on 5 nm node gate-all-around (GAA) silicon vertical field-effect transistor (VFET) devices are studied through technology computer-aided design (TCAD) simulations and spice simulation based on BSIM-CMG model. Compared to conventional lateral FET devices, VFETs can increase the gate area effectively while minimizing the loss of layout area due to their structural characteristics. Considering VFET devices below 5 nm node, an expansion of the gate area of the device reduces the influence of WFV. However, the effect of GV is exacerbated by weakening gate controllability. In order to analyze the exact variability issues, it is necessary to consider not only the influence by the WFV but also the influence by the GV. Therefore, we propose accurate guideline by analyzing the integrated variability issues in a various VFET device structures in a single device and a 6-T SRAM bit cells.
RESUMEN
In this study, we present the fabrication and characterization of ZnO nanorods (NRs) grown on p-Si, gold (Au) and nickel (Ni) coated on Si wafer, indium tin oxide (ITO), and quartz substrates. The aqueous chemical growth method is used for the vertical growth of ZnO NRs on multiple substrates. The samples are characterized with scanning electron microscope and energy dispersive X-ray spectroscopy to probe into the growth, alignment, density, diameter, and length of ZnO NRs on multiple substrates. It is found that under same conditions, like growth temperature, growth time, and solution concentration, ZnO NRs on ITO and quartz have same length but comparatively larger diameter than on other samples. The effects of growth time on the diameter and length of ZnO NRs are also explored. All the samples are characterized with probe station to look at the current-voltage (I-V) behavior of ZnO NRs on multiple substrates. It is found that ZnO NRs on p-Si show a simple p-n heterojunction diode like behavior. ZnO NRs grown on Au- and Ni-coated Si wafers show Schottky I-V characteristic behaviors while ZnO NRs on ITO show a simple ohmic I-V response with comparatively higher level of current. Finally, the I-V response of ZnO NRs on p-Si is also studied under ultraviolet illumination. Because of the photo-generated carriers in ZnO, the sample shows higher level of current upon illumination.