Label-free monitoring of immuno-specific interactions of adsorbed multilayer of proteins.

Protein-protein interactions in adsorbed multilayer of an immuno-specific system of proteins that include staphylococcal protein A (SpA), bovine serum albumin (BSA), anti-chicken immunoglobulin Y (ac-IgG), chicken serum IgG (cs-IgG), and rabbit serum IgG (rs-IgG) on polystyrene (PS) were studied using attenuated total reflection-Fourier transform infrared spectroscopy. A systematic analysis allowed a direct qualitative and quantitative determination of protein interactions at each step of specific and nonspecific binding conditions at the molecular level. The study also provided information about (1) the adsorption behavior of the proteins, (2) the role of SpA in enabling correct orientation of the adsorbed IgG and maintaining the stability of the adsorbed SpA/ac-IgG system on the PS surface, (3) the function of BSA as both blocking reagent and promoter of specific and selective binding, and (4) the bioactivity conserved accommodation of SpA molecules on the PS surface. Furthermore, the unique characteristics of cs-IgG such as passive toward SpA adsorption and exposure of the multivalence state at nonspecific binding conditions was revealed spectroscopically. The present investigation provides a platform for further extension of the adopted methodology to a more complex system of immuno-detection for highly sensitive and rapid diagnostics.

Binary mask designs with single- and double-layer absorber stacks for extreme ultraviolet lithography and actinic inspection.

In this study, we propose binary mask (BIM) designs with single- and double-layer absorber stacks with high optical contrast at a wavelength of 13.5 nm for use in extreme ultraviolet lithography (EUVL) and actinic defect inspection. The optimum thickness of the absorber stack was estimated using a method based on the transfer matrix. In the double-layer designs, [Ag/SnTe] has a minimum thickness of ∼32 nm with almost 100% optical contrast compared to the TaN layer. In addition, a SnTe absorber layer was deposited using radio frequency magnetron sputtering. The optical constant of the SnTe layer at 13.5 nm wavelength was determined using the density of the layer, which was obtained from x-ray reflectivity measurements. The reflectance of the SnTe single-layer absorber stack was measured in the EUV region and compared with the simulated reflectance by using the calculated optical constants. The results show that the new BIM designs for EUVL and actinic inspection can be helpful in reducing the geometric shadow effect compared to the TaN absorber layer with a thickness of ∼70 nm.