We develop a filtered absolute extreme ultraviolet (AXUV) diode array to measure the time evolution of the soft x-ray spectrum in the energy range of 1-10 keV. AXUV-HS5, the detector, has a fast rise time of 0.7 ns, a wide energy detection range, and high accessibility. We use Geant4 simulations to design an appropriate filter set for flat-and-sharp virtual channels (VCs), where a filter with no spectral edge removes large tails of the response curves. A Levenberg-Marquardt (LM) method, sensitive to the expected spectral function, is improved to reliably generate a continuous radiation spectrum, by utilizing spectral information from the least-squares (LS) method that reconstructs a discrete spectrum with low spectral resolution directly from the VCs. We test the filtered AXUV diode array on an X-pinch device with a peak current of 140 kA at Seoul National University; the array with ten channels is installed in a vacuum chamber. For a two-wire 40 µm stainless steel X-pinch, x-ray power, radiation temperature, and the reconstructed x-ray spectrum are obtained from the filtered AXUV diode array by the combined LS-LM method.
This paper describes an X-pinch device recently developed at Seoul National University (SNU). The SNU X-pinch device is designed and fabricated to accommodate various diagnostics as well as conduct versatile experiments. It is easy to change the capacitance of the pulse generator because the capacitor bank has a modular design without insulation oil or gas. This allows us to perform a variety of experiments with a wide capacitance range from 80 to 800 nF. The operating voltage of the SNU X-pinch device is controlled from 20 to 100 kV by adjusting the gas pressure inside a triggered spark-gap switch. Triggering of the spark-gap switch is synchronized with the operation of a pulsed laser to diagnose the X-pinch plasma at the proper time. A large vacuum chamber precisely machined from an aluminum mono-block is attached to the top of the pulse generator. It is designed to accommodate not only various X-pinch loads but also various diagnostic apparatus such as optical components. Initial experiments with the SNU X-pinch device have successfully generated x rays with wires of various materials and sizes. The device will be used not only to explore the dynamics of X-pinch plasmas but also as a test stand for diagnostics of high-energy-density plasmas.
Having a sub-ns response time and not requiring physical contacts to the measurement points, a voltage measurement system based on the Pockels electro-optic effect, referred to as a PE (Pockels effect)-based voltmeter, is widely used for pulsed high voltage devices such as accelerators and X-pinch systems. To correct for the misalignment of a Pockels cell and the transmittance ratio of a beam splitter, a polar-coordinate-based data analysis scheme has been proposed. This scheme also overcomes a limitation on the measurable range of a PE-based voltmeter without ambiguity and can measure the half-wave voltage of a Pockels cell. We present an improved polar-coordinate-based data analysis scheme using an ellipse fitting method, which can correct for misalignments of all the optics components of a PE-based voltmeter while keeping the advantages of the previous scheme. We show the results of the improved data analysis scheme for measuring a slowly modulated voltage up to approximately 5 kV in about 30 s and a pulsed high voltage up to 7 kV with a rise time of less than 20 ns.
