RESUMEN
Laser enhanced field evaporation of surface atoms in laser-assisted Atom Probe Tomography (APT) can simultaneously excite photoluminescence in semiconductor or insulating specimens. An atom probe equipped with appropriate focalization and collection optics has been coupled with an in situ micro-photoluminescence (µPL) bench that can be operated during APT analysis. The photonic atom probe instrument we have developed operates at frequencies up to 500 kHz and is controlled by 150 fs laser pulses tunable in energy in a large spectral range (spanning from deep UV to near IR). Micro-PL spectroscopy is performed using a 320 mm focal length spectrometer equipped with a CCD camera for time-integrated and with a streak camera for time-resolved acquisitions. An example of application of this instrument on a multi-quantum well oxide heterostructure sample illustrates the potential of this new generation of tomographic atom probes.
RESUMEN
The geometry of atom probe tomography tips strongly differs from standard scanning transmission electron microscopy foils. Whereas the later are rather flat and thin (<20 nm), tips display a curved surface and a significantly larger thickness. As far as a correlative approach aims at analysing the same specimen by both techniques, it is mandatory to explore the limits and advantages imposed by the particular geometry of atom probe tomography specimens. Based on simulations (electron probe propagation and image simulations), the possibility to apply quantitative high angle annular dark field scanning transmission electron microscopy to of atom probe tomography specimens has been tested. The influence of electron probe convergence and the benefice of deconvolution of electron probe point spread function electron have been established. Atom counting in atom probe tomography specimens is for the first time reported in this present work. It is demonstrated that, based on single projections of high angle annular dark field imaging, significant quantitative information can be used as additional input for refining the data obtained by correlative analysis of the specimen in APT, therefore opening new perspectives in the field of atomic scale tomography.
RESUMEN
We propose a system allowing the characterization of thin magnetic multilayer structures that combine conversion electron Mossbauer spectrometry (CEMS) under applied magnetic field with the magneto-optical Kerr effect (MOKE) technique. Measured hysteresis loops obtained from the MOKE part are used for investigation of sample surface magnetic properties. The CEMS part of such a system is suitable for studying the spatial spin distribution during magnetization reversal under applied magnetic field, whose values are established from the measured MOKE loop. The combined technique is demonstrated on the results obtained at 300 K on an exchange-coupled ferrimagnetic amorphous GdFe/TbFe bilayer, where the center of the GdFe layer is enriched in (57)Fe. Both techniques confirm in-plane uniaxial anisotropy. The spin structure at the position of the probe layer is analyzed for several values of the external magnetic field applied in the hard magnetization axis direction.
