Hard-X-ray dark-field imaging using a grating interferometer.

Imaging with visible light today uses numerous contrast mechanisms, including bright- and dark-field contrast, phase-contrast schemes and confocal and fluorescence-based methods. X-ray imaging, on the other hand, has only recently seen the development of an analogous variety of contrast modalities. Although X-ray phase-contrast imaging could successfully be implemented at a relatively early stage with several techniques, dark-field imaging, or more generally scattering-based imaging, with hard X-rays and good signal-to-noise ratio, in practice still remains a challenging task even at highly brilliant synchrotron sources. In this letter, we report a new approach on the basis of a grating interferometer that can efficiently yield dark-field scatter images of high quality, even with conventional X-ray tube sources. Because the image contrast is formed through the mechanism of small-angle scattering, it provides complementary and otherwise inaccessible structural information about the specimen at the micrometre and submicrometre length scale. Our approach is fully compatible with conventional transmission radiography and a recently developed hard-X-ray phase-contrast imaging scheme. Applications to X-ray medical imaging, industrial non-destructive testing and security screening are discussed.

Improved data acquisition in grazing-incidence X-ray scattering experiments using a pixel detector.

The use of an area detector in grazing-incidence X-ray experiments lends many advantages in terms of both speed and reliability. Here a discussion is given of the procedures established using the PILATUS pixel detector developed at the Swiss Light Source for optimizing data acquisition and analysis of surface diffraction data at the Materials Science beamline, especially with regard to reflectivity measurements, crystal truncation and fractional order rods, and grazing-incidence diffraction experiments.

Precise measurement of the pi+-->pi0 e+nu branching ratio.

Using a large acceptance calorimeter and a stopped pion beam we have made a precise measurement of the rare pi(+)-->pi(0)e(+)nu (pi(beta)) decay branching ratio. We have evaluated the branching ratio by normalizing the number of observed pi(beta) decays to the number of observed pi(+)-->e(+)nu (pi(e2)) decays. We find the value of Gamma(pi(+)-->pi(0)e(+)nu)/Gamma(total)=[1.036+/-0.004(stat)+/-0.004(syst)+/-0.003(pi(e2))]x10(-8), where the first uncertainty is statistical, the second systematic, and the third is the pi(e2) branching ratio uncertainty. Our result agrees well with the standard model prediction.