A simple, static and stage mounted direct electron detector based electron backscatter diffraction system.

To engineer the next generation of advanced materials we must understand their microstructure, and this requires microstructural characterization. This can be achieved through the collection of high contrast, data rich, and insightful microstructural maps. Electron backscatter diffraction (EBSD) has emerged as a popular tool available within the scanning electron microscope (SEM), where maps are realized through the repeat capture and analysis of Kikuchi diffraction patterns. Typical commercial EBSD systems require large and sophisticated detectors that are mounted on the side of the SEM vacuum chamber which can be limiting in terms of widespread access to the technique. In this work, we present an alternative open-hardware solution based upon a compact EBSD system with a simple, static geometry that uses an off-the-shelf direct electron detector co-mounted with a sample. This simple stage is easy to manufacture and improves our knowledge of the diffraction geometry significantly. Microscope and detector control is achieved through software application programming interface (API) integration. After pattern capture, analysis of the diffraction patterns is performed using open-source analysis within AstroEBSD. To demonstrate the potential of this set up, we present two simple EBSD experiments using a line scan and area mapping. We hope that the present system can inspire simpler EBSD system design for widespread access to the EBSD technique and promote the use of open-source software and hardware in the workflow of EBSD experiments.

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors.

Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials typically diffraction pattern analysis is performed in the transmission electron microscope (TEM) and TEM diffraction patterns typically have a limited angular range (less than a few degrees) due to the long camera length, and this requires analysis of multiple patterns to probe a unit cell. As a different approach, wide angle Kikuchi patterns can be captured using an on-axis detector in the scanning electron microscope (SEM) with a shorter camera length. These 'transmission Kikuchi diffraction' (TKD) patterns present a direct projection of the unit cell and can be routinely analysed using EBSD-based methods and dynamical diffraction theory. In the present work, we enhance this analysis significantly and present a multi-exposure diffraction pattern fusion method that increases the dynamic range of the detected patterns captured with a Timepix3-based direct electron detector (DED). This method uses an easy-to-apply exposure fusion routine to collect data and extend the dynamic range, as well as normalise the intensity distribution within these very wide (>95°) angle patterns. The potential of this method is demonstrated with full diffraction sphere reprojection and highlight potential of the approach to rapidly probe the structure of nano-structured materials in the scanning electron microscope.

Transmission Kikuchi Diffraction Mapping Induces Structural Damage in Atom Probe Specimens.

Measuring local chemistry of specific crystallographic features by atom probe tomography (APT) is facilitated by using transmission Kikuchi diffraction (TKD) to help position them sufficiently close to the apex of the needle-shaped specimen. However, possible structural damage associated to the energetic electrons used to perform TKD is rarely considered and is hence not well-understood. Here, in two case studies, we evidence damage in APT specimens from TKD mapping. First, we analyze a solid solution, metastable ß-Ti-12Mo alloy, in which the Mo is expected to be homogenously distributed. Following TKD, APT reveals a planar segregation of Mo among other elements. Second, specimens were prepared near Σ3 twin boundaries in a high manganese twinning-induced plasticity steel, and subsequently charged with deuterium gas. Beyond a similar planar segregation, voids containing a high concentration of deuterium, i.e., bubbles, are detected in the specimen on which TKD was performed. Both examples showcase damage from TKD mapping leading to artefacts in the distribution of solutes. We propose that the structural damage is created by surface species, including H and C, subjected to recoil from incoming energetic electrons during mapping, thereby getting implanted and causing cascades of structural damage in the sample.

Optimizing broad ion beam polishing of zircaloy-4 for electron backscatter diffraction analysis.

To provide useful materials characterization, we must prepare samples well so that we can avoid studying artefacts induced during sample preparation. This motivates us to systematically study our preparation methods. In this work, we focus on improving "broad ion beam" (BIB) polishing through a combination of consideration of the ion-sample interactions and a systematic study of options provided by commonly available broad ion beam milling machines. Our study specifically aims to optimise the preparation of zircaloy-4, which is an alloy of zirconium used in nuclear fuel cladding, and we note that this alloy is difficult to prepare with other sample preparations routes. We optimise BIB polishing to study the microstructure of the zircaloy-4 with electron microscopy based electron backscatter diffraction (EBSD). To conclude our study, we provide recommendations for new users of BIB based polishing methods.

Quantification Challenges for Atom Probe Tomography of Hydrogen and Deuterium in Zircaloy-4.

Analysis and understanding of the role of hydrogen in metals is a significant challenge for the future of materials science, and this is a clear objective of recent work in the atom probe tomography (APT) community. Isotopic marking by deuteration has often been proposed as the preferred route to enable quantification of hydrogen by APT. Zircaloy-4 was charged electrochemically with hydrogen and deuterium under the same conditions to form large hydrides and deuterides. Our results from a Zr hydride and a Zr deuteride highlight the challenges associated with accurate quantification of hydrogen and deuterium, in particular associated with the overlap of peaks at a low mass-to-charge ratio and of hydrogen/deuterium containing molecular ions. We discuss possible ways to ensure that appropriate information is extracted from APT analysis of hydrogen in zirconium alloy systems that are important for nuclear power applications.

Data on a new beta titanium alloy system reinforced with superlattice intermetallic precipitates.

The data presented in this article are related to the research article entitled "a new beta titanium alloy system reinforced with superlattice intermetallic precipitates" (Knowles et al., 2018) [1]. This includes data from the as-cast alloy obtained using scanning electron microscopy (SEM) and x-ray diffraction (XRD) as well as SEM data in the solution heat treated condition. Transmission electron microscopy (TEM) selected area diffraction patterns (SADPs) are included from the alloy in the solution heat treated condition, as well as the aged condition that contained < 100 nm B2 TiFe precipitates [1], the latter of which was found to exhibit double diffraction owing to the precipitate and matrix channels being of a similar width to the foil thickness (Williams and Carter, 2009) [2]. Further details are provided on the macroscopic compression testing of small scale cylinders. Of the micropillar deformation experiment performed in [1], SEM micrographs of focused ion beam (FIB) prepared 2 µm micropillars are presented alongside those obtained at the end of the in-situ SEM deformation as well as videos of the in-situ deformation. Further, a table is included that lists the Schmidt factors of all the possible slip systems given the crystal orientations and loading axis of the deformed micropillars in the solution heat treated and aged conditions.

In situ stable crack growth at the micron scale.

Grain boundaries typically dominate fracture toughness, strength and slow crack growth in ceramics. To improve these properties through mechanistically informed grain boundary engineering, precise measurement of the mechanical properties of individual boundaries is essential, although it is rarely achieved due to the complexity of the task. Here we present an approach to characterize fracture energy at the lengthscale of individual grain boundaries and demonstrate this capability with measurement of the surface energy of silicon carbide single crystals. We perform experiments using an in situ scanning electron microscopy-based double cantilever beam test, thus enabling viewing and measurement of stable crack growth directly. These experiments correlate well with our density functional theory calculations of the surface energy of the same silicon carbide plane. Subsequently, we measure the fracture energy for a bi-crystal of silicon carbide, diffusion bonded with a thin glassy layer.To improve mechanical properties in ceramics through grain boundary engineering, precise mechanical characterization of individual boundaries is vital yet difficult to achieve. Here authors perform experiments using an in situ scanning electron microscopy based double cantilever beam test, allowing to directly view and measure stable crack growth in silicon carbide.

Toward Predictive Understanding of Fatigue Crack Nucleation in Ni-Based Superalloys.

Predicting when and where materials fail is a holy grail for structural materials engineering. Development of a predictive capability in this domain will optimize the employment of existing materials, as well as rapidly enhance the uptake of new materials, especially in high-risk, high-value applications, such as aeroengines. In this article, we review and outline recent efforts within our research groups that focus on utilizing full-field measurement and calculation of micromechanical deformation in Ni-based superalloys. In paticular, we employ high spatial resolution digital image correlation (HR-DIC) to measure surface strains and a high-angular resolution electron backscatter diffraction technique (HR-EBSD) to measure elastic distortion, and we combine these with crystal plasticity finite element (CPFE) modeling. We target our studies within a system of samples that includes single, oligo, and polycrystals where the boundary conditions, microstructure, and loading configuration are precisely controlled. Coupling of experiment and simulation in this manner enables enhanced understanding of crystal plasticity, as demonstrated with case studies in deformation compatibility; spatial distributions of slip evolution; deformation patterning around microstructural defects; and ultimately development of predictive capability that probes the location of microstructurally sensitive fatigue cracks. We believe that these studies present a careful calibration and validation of our experimental and simulation-based approaches and pave the way toward new understanding of crack formation in engineering alloys.

Deformation compatibility in a single crystalline Ni superalloy.

Deformation in materials is often complex and requires rigorous understanding to predict engineering component lifetime. Experimental understanding of deformation requires utilization of advanced characterization techniques, such as high spatial resolution digital image correlation (HR-DIC) and high angular resolution electron backscatter diffraction (HR-EBSD), combined with clear interpretation of their results to understand how a material has deformed. In this study, we use HR-DIC and HR-EBSD to explore the mechanical behaviour of a single-crystal nickel alloy and to highlight opportunities to understand the complete deformations state in materials. Coupling of HR-DIC and HR-EBSD enables us to precisely focus on the extent which we can access the deformation gradient, F , in its entirety and uncouple contributions from elastic deformation gradients, slip and rigid body rotations. Our results show a clear demonstration of the capabilities of these techniques, found within our experimental toolbox, to underpin fundamental mechanistic studies of deformation in polycrystalline materials and the role of microstructure.

The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.

High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross-correlation analysis. To explore this concern, patterns from the interior of two grains have been mixed to simulate the interaction volume crossing a grain boundary so that the effect on the accuracy of the cross correlation results can be tested. It was found that the accuracy of HR-EBSD strain measurements performed in a FEG-SEM on zirconium remains good until the incident beam is less than 18 nm from a grain boundary. A simulated microstructure was used to measure how often pattern overlap occurs at any given EBSD step size, and a simple relation was found linking the probability of overlap with step size.

Controlling the orientation, edge geometry, and thickness of chemical vapor deposition graphene.

We report that the shape, orientation, edge geometry, and thickness of chemical vapor deposition graphene domains can be controlled by the crystallographic orientations of Cu substrates. Under low-pressure conditions, single-layer graphene domains align with zigzag edges parallel to a single <101> direction on Cu(111) and Cu(101), while bilayer domains align to two directions on Cu(001). Under atmospheric pressure conditions, hexagonal domains also preferentially align. This discovery can be exploited to generate high-quality, tailored graphene with controlled domain thickness, orientations, edge geometries, and grain boundaries.