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Phys Rev E Stat Nonlin Soft Matter Phys
; 65(3 Pt 2A): 036222, 2002 Mar.
Article
in English
| MEDLINE
| ID: mdl-11909227
ABSTRACT
Recently, it has been reported that the characteristic relation of type-I intermittency in the presence of noise is deformed nontrivially as the channel width epsilon changes from the positive region to the negative. In order to verify it experimentally as a real phenomenon, we study the characteristic relations both for epsilon<0 and for epsilon>0 in a simple inductor-resistor-diode circuit that is under noisy circumstances. The experimental results agree well with the theoretical expectation that the characteristic relations are