1.
Opt Lett
; 44(12): 3126-3129, 2019 Jun 15.
Article
in English
| MEDLINE
| ID: mdl-31199397
ABSTRACT
The Fourier transform-infrared (FT-IR) spectrometer is a widely used high-resolution spectral characterization method in materials, chemicals, and more. However, the inverse relation between the spectral resolution and the interferometer's arm length yields a tradeoff between spectral resolution and spectrometer footprint. Here, we introduce a novel method to overcome this traditional FT-IR resolution limit. The enhanced high-resolution multi-scan compact FT-IR spectrometer we present achieves an effectively long interferogram by combining multiple short FT-IR scans. Simulation and experimental results demonstrate a significant increase in the spectral resolution of a FT-IR spectrometer by employing our interferogram stitching algorithm.