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1.
Nat Mater ; 13(2): 168-72, 2014 Feb.
Article in English | MEDLINE | ID: mdl-24317186

ABSTRACT

Elementary particles such as electrons or photons are frequent subjects of wave-nature-driven investigations, unlike collective excitations such as phonons. The demonstration of wave-particle crossover, in terms of macroscopic properties, is crucial to the understanding and application of the wave behaviour of matter. We present an unambiguous demonstration of the theoretically predicted crossover from diffuse (particle-like) to specular (wave-like) phonon scattering in epitaxial oxide superlattices, manifested by a minimum in lattice thermal conductivity as a function of interface density. We do so by synthesizing superlattices of electrically insulating perovskite oxides and systematically varying the interface density, with unit-cell precision, using two different epitaxial-growth techniques. These observations open up opportunities for studies on the wave nature of phonons, particularly phonon interference effects, using oxide superlattices as model systems, with extensive applications in thermoelectrics and thermal management.


Subject(s)
Calcium Compounds/chemistry , Models, Chemical , Oxides/chemistry , Titanium/chemistry , Computer Simulation , Crystallization , Materials Testing , Scattering, Radiation , Thermal Conductivity
2.
ACS Nano ; 5(1): 640-6, 2011 Jan 25.
Article in English | MEDLINE | ID: mdl-21162539

ABSTRACT

Oxide heterostructure superlattices constitute a new family of materials with tunable ferroelectric properties. While theoretical models predict the presence of nanosized ferroelectric domains in these films, they had not been observed as the magnitude of the response functions challenges the limits of experimental detection. Here, a new protocol in a precise variant of piezoforce microscopy is used to image domains in BaTiO(3)/SrTiO(3) superlattices. Comparison of experimentally determined polarization to predictions of phase-field calculations is in quantitative agreement. Additionally, a combination of theory and experiment is used to determine the magnitude of internal electric field within the thin film, in a procedure that can be generalized to all ferroelectric films.

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