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1.
Appl Opt ; 63(14): 3736-3744, 2024 May 10.
Article in English | MEDLINE | ID: mdl-38856335

ABSTRACT

Defect inspection is required in various fields, and many researchers have attempted deep-learning algorithms for inspections. Deep-learning algorithms have advantages in terms of accuracy and measurement time; however, the reliability of deep-learning outputs is problematic in precision measurements. This study demonstrates that iterative estimation using neighboring feature maps can evaluate the uncertainty of the outputs and shows that unconfident error predictions have higher uncertainties. In ghost imaging using deep learning, the experimental results show that removing outputs with higher uncertainties improves the accuracy by approximately 15.7%.

2.
Appl Opt ; 61(23): 6714-6721, 2022 Aug 10.
Article in English | MEDLINE | ID: mdl-36255749

ABSTRACT

We explore the contribution of convolutional neural networks to correcting for the effect of the point spread function (PSF) of the optics when applying ghost imaging (GI) combined with deep learning to identify defect positions in materials. GI can be accelerated by combining GI and deep learning. However, no method has been established for determining the relevant model parameters. A simple model with different kernel sizes was built. Its accuracy was evaluated for data containing the effects of different PSFs. Numerical analysis and empirical experiments demonstrate that the accuracy of defect identification improved by matching the kernel size with the PSF of the optics.


Subject(s)
Deep Learning , Neural Networks, Computer , Diagnostic Imaging
3.
Appl Opt ; 61(34): 10126-10133, 2022 Dec 01.
Article in English | MEDLINE | ID: mdl-36606774

ABSTRACT

Defect detection requires highly sensitive and robust inspection methods. This study shows that non-overlapping illumination patterns can improve the noise robustness of deep learning ghost imaging (DLGI) without modifying the convolutional neural network (CNN). Ghost imaging (GI) can be accelerated by combining GI and deep learning. However, the robustness of DLGI decreases in exchange for higher speed. Using non-overlapping patterns can decrease the noise effects in the input data to the CNN. This study evaluates the DLGI robustness by using non-overlapping patterns generated based on binary notation. The results show that non-overlapping patterns improve the position accuracy by up to 51%, enabling the detection of defect positions with higher accuracy in noisy environments.


Subject(s)
Deep Learning , Neural Networks, Computer , Diagnostic Imaging
4.
Opt Express ; 28(24): 36924-36935, 2020 Nov 23.
Article in English | MEDLINE | ID: mdl-33379776

ABSTRACT

Developing a suitable production method for three-dimensional periodic nanostructures with high aspect ratios is a subject of growing interest. For mass production, Talbot lithography offers many advantages. However, one disadvantage is that the minimum period of the light intensity distribution is limited by the period of the diffraction grating used. To enhance the aspect ratio of fabricated nanostructures, in the present study we focus on multiple wave interference between diffracted waves created using the Talbot effect. We propose a unique exposure method to generate multiple wave interference between adjacent diffraction orders by controlling the angle of incidence of an ultraviolet (UV) light source. Using finite-difference time-domain simulations, we obtain fringe patterns with a sub-wavelength period using a one-dimensional periodic grating mask. Moreover, we demonstrate the practical application of this approach by using UV lithography to fabricate sub-wavelength periodic photopolymer-based structures with an aspect ratio of 30 in millimeter-scale areas, indicating its suitability for mass production.

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