RESUMEN
Neurological implants that harvest ultrasound power have the potential to provide long-term stimulation without complications associated with battery power. An important safety question associated with long-term operation of the implant involves the heat generated by the interaction of the device with the ultrasound field. A study was performed in which the temperature rise generated by this interaction was measured. Informed by temperature data from thermocouples outside the ultrasound beam, a mathematical inverse method was used to determine the volume heat source generated by ultrasound absorption within the implant as well as the surface heat source generated within the viscous boundary layer on the surface of the implant. For the test implant used, it was determined that most of the heat was generated in the boundary layer, giving a maximum temperature rise â¼5 times that for absorption in an equivalent volume of soft tissue. This result illustrates that thermal safety guidelines based solely on ultrasound absorption of tissue alone are not sufficient. The method presented represents an alternative approach for quantifying ultrasound thermal effects in the presence of implants. The analysis shows a steady temperature rise of about 0.2 °C for every 100 mW/cm2 for the presented test implant.