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2.
J Nanosci Nanotechnol ; 12(11): 8651-5, 2012 Nov.
Artículo en Inglés | MEDLINE | ID: mdl-23421259

RESUMEN

We investigate optical properties of a new complex plasmonic nanostructure, which consists of a spherical metallic nanoshell and a small metallic nanoparticle ("nanoknob") situated on its surface. The plasmon resonance wavelength of the entire structure is guided by the geometrical and material properties of the nanoshell whereas the electromagnetic field of the incident light is localized and enhanced near the "nanoknob". The idea is supported with electromagnetic modeling and near-field optical microscopy imaging. In addition, we proposed and demonstrated a new method of nanoparticle precise manipulation under electron beam, which could be used in fabrication of such plasmonic structures and other nanosized elements.


Asunto(s)
Nanopartículas del Metal/química , Nanopartículas del Metal/ultraestructura , Modelos Químicos , Modelos Moleculares , Resonancia por Plasmón de Superficie/métodos , Simulación por Computador , Luz , Dispersión de Radiación
3.
Ultramicroscopy ; 111(11): 1630-5, 2011 Nov.
Artículo en Inglés | MEDLINE | ID: mdl-21963780

RESUMEN

The spatial resolution and high sensitivity of tip-enhanced Raman spectroscopy allows the characterization of surface features on a nano-scale. This technique is used to visualize silicon-based structures, which are similar in width to the transistor channels in present leading-edge CMOS devices. The reduction of the intensive far-field background signal is crucial for detecting the weak near-field contributions and requires beside a careful alignment of laser polarization and tip axis also the consideration of the crystalline sample orientation. Despite the chemical identity of the investigated sample surface, the structures can be visualized by the shift of the Raman peak positions due to the patterning induced change of the stress distribution within lines and substrate layer. From the measured peak positions the intrinsic stress within the lines is calculated and compared with results obtained by finite element modeling. The results demonstrate the capability of the tip-enhanced Raman technique for strain analysis on a sub-50nm scale.

4.
Small ; 1(11): 1088-93, 2005 Nov.
Artículo en Inglés | MEDLINE | ID: mdl-17193401

RESUMEN

Temperature control on the nanometer scale is a challenging task in many physical, chemical, and material science applications where small experimental volumes with high temperature gradients are used. The crucial difficulty is reducing the size of temperature sensors while keeping their sensitivity, working temperature range, and, most importantly, their simplicity and accuracy of temperature reading. In this work, we demonstrate the ultimate miniaturization of the classic thermometer using an expanding column of liquid gallium inside a multi-walled C nanotube for precise temperature measurements. We report that electrical conductivity through unfilled nanotube regions is diffusive with a resistance per unit length of approximately 10 kOmega microm(-1), whereas Ga-filled segments of the nanotube show metallic behavior with a low resistance of approximately 100 Omega microm(-1). No noticeable Schottky barrier exists between the nanotube carbon shell and the inner Ga filling. Based on these findings, an individual carbon nanotube partially filled with liquid Ga is used as a temperature sensor and/or switch. The nanotube's electrical resistance decreases linearly with increasing temperature as the metallic Ga column expands inside the tube channel. In addition, the tube resistance drops sharply when two encapsulated Ga columns approaching each other meet inside the nanotube, producing a switching action that can occur at any predetermined temperature, as the Ga column position inside the nanotube can be effectively pre-adjusted by nanoindentation using an atomic force microscope.


Asunto(s)
Galio/química , Nanotecnología/instrumentación , Nanotecnología/métodos , Nanotubos de Carbono/química , Técnicas Biosensibles , Difusión , Conductividad Eléctrica , Electroquímica/métodos , Ensayo de Materiales , Microscopía de Fuerza Atómica , Microscopía Electrónica de Rastreo , Microscopía Electrónica de Transmisión , Nanotubos/química , Semiconductores , Temperatura
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