RESUMEN
The changes in the microtopography of a metal surface during a corrosion process are measured by decorrelation of the scattered speckle fields under coherent illumination. For that purpose a quantitative relation between the decorrelation of the scattered light fields and the rate of corrosion is established in a theoretical model, based on the statistics of phase and reflectivity changes of point scatterers at the surface. The speckle fields are recorded by a CCD camera and processed numerically in a computer, yielding the standard deviation of the topography changes with nanometer sensitivity. From the analysis of a series of images taken at equal time intervals during the corrosion process, the degree of interrelation among subsequent topography changes is calculated.
RESUMEN
Ambiguity in the conversion of phase measurements to deformation values restricts the applicability of electronic speckle-pattern interferometry. The use of two wavelengths greatly relaxes this restriction.