RESUMEN
We present a study on subsurface imaging with an infrared scattering-type scanning near-field optical microscope (s-SNOM). The depth-limitation for the visibility of gold nanoparticles with a diameter of 50 nm under Si3N4 is determined to about 50 nm. We first investigate spot size and signal strength concerning their particle-size dependence for a dielectric cover layer with positive permittivity. The experimental results are confirmed by model calculations and a comparison to TEM images. In the next step, we investigate spectroscopically also the regime of negative permittivity of the capping layer and its influence on lateral resolution and signal strength in experiment and simulations. The explanation of this observation combines subsurface imaging and superlensing, and shows up limitations of the latter regarding small structure sizes.
RESUMEN
We report nanoscale-resolved optical investigations on the local material properties of Sb2Te3 hexagonal platelets grown by solvothermal synthesis. Using mid-infrared near-field microscopy, we find a highly symmetric pattern, which is correlated to a growth spiral and which extends over the entire platelet. As the origin of the optical contrast, we identify domains with different densities of charge carriers. On Sb2Te3 samples grown by other means, we did not find a comparable domain structure.
Asunto(s)
Antimonio/química , Plaquetas/ultraestructura , Nanotecnología , Telurio/química , Plaquetas/química , Cristalización , Humanos , Rayos Infrarrojos , Microscopía , Óptica y FotónicaRESUMEN
We present the design and implementation of a scanning probe microscope, which combines electrically detected magnetic resonance (EDMR) and (photo-)conductive atomic force microscopy ((p)cAFM). The integration of a 3-loop 2-gap X-band microwave resonator into an AFM allows the use of conductive AFM tips as a movable contact for EDMR experiments. The optical readout of the AFM cantilever is based on an infrared laser to avoid disturbances of current measurements by absorption of straylight of the detection laser. Using amorphous silicon thin film samples with varying defect densities, the capability to detect a spatial EDMR contrast is demonstrated. Resonant current changes as low as 20 fA can be detected, allowing the method to realize a spin sensitivity of 8×10(6)spins/âHz at room temperature.
RESUMEN
Plasmonic antennas are crucial components for nano-optics and have been extensively used to enhance sensing, spectroscopy, light emission, photodetection, and others. Recently, there is a trend to search for new plasmonic materials with low intrinsic loss at new plasmon frequencies. As an alternative to metals, polar crystals have a negative real part of permittivity in the Reststrahlen band and support surface phonon polaritons (SPhPs) with weak damping. Here, we experimentally demonstrate the resonance of single circular microcavities in a thin gold film deposited on a silicon carbide (SiC) substrate in the mid-infrared range. Specifically, the negative permittivity of SiC leads to a well-defined, size-tunable SPhP resonance with a Q factor of around 60 which is much higher than those in surface plasmon polariton (SPP) resonators with similar structures. These infrared resonant microcavities provide new possibilities for widespread applications such as enhanced spectroscopy, sensing, coherent thermal emission, and infrared photodetectors among others throughout the infrared frequency range.
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We present a systematic study of the effect of the tip vibration amplitude in scattering-type scanning near-field optical microscopy (s-SNOM) on the visibility of buried structures in terms of image contrast, signal strength, and noise. When varying the tip vibration amplitude the visibility of structures and the image contrast change in opposite directions. We address the question how to optimize the tip vibration amplitude in practice and discuss the respective advantages of either high contrast or low noise. Besides for subsurface imaging, our findings can also be applied to the imaging of structures with a low material contrast on the surface.
RESUMEN
We present a quantitative quasi-analytical model to predict and analyze signals on layered samples measured by infrared scattering-type scanning near-field optical microscopy. Our model predictions are compared to experimental data and to fully retarded calculations based on a point dipole approximation of the tip. The model is used to study the influence of the tip vibration amplitude and of the tip radius on the near-field contrasts of samples with particularly small variations in the layer thickness. Additionally the influence of a dielectric capping layer on the tip-substrate coupling is analyzed. When inversely applied, our calculation opens the possibility to extract the local layer thickness of thin films or the dielectric functions that allow one to draw conclusions on the material composition, conductivity or crystal structure on the nanoscale.