Pendellösung interferometry probes the neutron charge radius, lattice dynamics, and fifth forces.

Structure factors describe how incident radiation is scattered from materials such as silicon and germanium and characterize the physical interaction between the material and scattered particles. We used neutron Pendellösung interferometry to make precision measurements of the (220) and (400) neutron-silicon structure factors and achieved a factor-of-four improvement in the (111) structure factor uncertainty. These data provide measurements of the silicon Debye-Waller factor at room temperature and the mean square neutron charge radius rn2=−0.1101±0.0089 square femtometers. Combined with existing measurements of the Debye-Waller factor and charge radius, the measured structure factors also improve constraints on the strength of a Yukawa modification to gravity by an order of magnitude over the 20 picometer­to­10 nanometer length scale range.

Neutron Imaging Using a Fine-Grained Nuclear Emulsion.

A neutron detector using a fine-grained nuclear emulsion has a sub-micron spatial resolution and thus has potential to be applied as high-resolution neutron imaging. In this paper, we present two approaches to applying the emulsion detectors for neutron imaging. One is using a track analysis to derive the reaction points for high resolution. From an image obtained with a 9 µm pitch Gd grating with cold neutrons, periodic peak with a standard deviation of 1.3 µm was observed. The other is an approach without a track analysis for high-density irradiation. An internal structure of a crystal oscillator chip, with a scale of approximately 30 µm, was able to be observed after an image analysis.

Measurement and alleviation of subsurface damage in a thick-crystal neutron interferometer.

The construction is described of a monolithic thick-crystal perfect silicon neutron interferometer using an ultra-high-precision grinding technique and a combination of annealing and chemical etching that differs from the construction of prior neutron interferometers. The interferometer is the second to have been annealed after machining and the first to be annealed prior to chemical etching. Monitoring the interference signal at each post-fabrication step provides a measurement of subsurface damage and its alleviation. In this case, the strain caused by subsurface damage manifests itself as a spatially varying angular misalignment between the two relevant volumes of the crystal and is reduced from ∼10-5 rad to ∼10-9 rad by way of annealing and chemical etching.

Development of a neutron detector based on a position-sensitive photomultiplier.

A neutron scintillation detector based on a position-sensitive photomultiplier has been developed for neutron spin echo and small angle neutron scattering measurements. This photomultiplier has good spatial resolution, less than 1 mm2. The detection efficiency of gamma ray background is very low for using a thin ZnS/6LiF scintillator. The effective area of this detector is around 60 cm2.