Microwave dielectric resonator biosensor for aqueous glucose solution.

We report a near-field microwave biosensor based on a dielectric resonator to detect glucose concentration. A microwave biosensor with a high Q dielectric resonator allows observation of the small variation of the glucose concentration by measuring the shift of the resonance frequency and the microwave reflection coefficient S(11). We observed the concentration of glucose with a detectable resolution up to 5 mgml at an operating frequency of about f=1.68 GHz. The change in the glucose concentration is directly related to the change in the reflection coefficient due to the electromagnetic interaction between the dielectric resonator and the glucose solution.

Characterization of magnetic materials using a scanning microwave microprobe.

We investigated the electromagnetic properties of metals of iron, nickel, cobalt, aluminum, gold, copper, silver, and permalloy thin films on SiO2 substrates using a near-field microwave microprobe. The electromagnetic properties of metal sheets were estimated by measuring the microwave reflection coefficient S(11) and compared with the theoretical values. We observed the hysteresis behavior of permalloy thin films on SiO2 substrates using a near-field scanning microwave microprobes (NSMM) system. Experimental results are in good agreement with the theoretical model of transmission theory. In order to better characterize the electromagnetic properties of metals and magnetic metals instead of the usual method, we take advantage of the noncontact microprobing evaluation capabilities using a near-field microwave.

Characterization of Alq3 thin films by a near-field microwave microprobe.

We observed tris-8-hydroxyquinoline aluminum (Alq3) thin films dependence on substrate heating temperatures by using a near-field microwave microprobe (NFMM) and by optical absorption at wavelengths between 200 and 900 nm. The changes of absorption intensity at different substrate heating temperatures are correlated to the changes in the sheet resistance of Alq3 thin films.

Investigation of CdS thin films by a near-field microwave microprobe.

Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S(11). CdS thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM.