Third and fifth order nonlinear susceptibilities in thin HfO2 layers.

Third harmonic generation (THG) from dielectric layers is investigated. By forming a thin gradient of HfO2 with continuously increasing thickness, we are able to study this process in detail. This technique allows us to elucidate the influence of the substrate and to quantify the layered materials third χ(3)(3ω: ω, ω, ω) and even fifth order χ(5)(3ω: ω, ω, ω, ω, - ω) nonlinear susceptibility at the fundamental wavelength of 1030 nm. This is to the best of our knowledge the first measurement of the fifth order nonlinear susceptibility in thin dielectric layers.

Potential hazards and mitigation of X-ray radiation generated by laser-induced plasma from research-grade laser systems.

A large range of laser-matter applications employ ultrashort pulses and high laser intensity. Such processes can lead to unrequired X-ray generation, which represents a hazardous radiation factor even for common laboratory research-grade laser systems. We present here an analysis of the radiation dose rate and X-ray spectrum emitted during ablation of a rotating copper cylinder with respect to several laser parameters. The results show that focused sub-picosecond pulses with intensity above 1013 W/cm2 can exceed the annual irradiation limit even in one hour, requiring appropriate shielding for the safety of the researchers.

Full characterization of 8 fs deep UV pulses via a dispersion scan.

We report on, to the best of our knowledge, the first characterization of deep ultraviolet (UV) pulses by the dispersion scan (d-scan) technique. Negatively chirped 8 fs deep UV pulses are generated via the phase transfer of shaped few-cycle near-infrared pulses in a sum frequency generation process with narrowband second harmonic. The pulses are characterized by a d-scan technique incorporating a cross-polarized wave (XPW) generation nonlinearity. Being a single-beam degenerate four-wave mixing process, XPW does not acquire frequency conversion and, thus, is ideally suited for characterizing pulses in the UV, where the material dispersion severely limits phase matching. The characterization method is benchmarked by measuring the dispersion effect of a known fused silica plate on the pulses.

Rapid phase retrieval of ultrashort pulses from dispersion scan traces using deep neural networks.

The knowledge of the temporal shape of femtosecond pulses is of major interest for all their applications. The reconstruction of the temporal shape of these pulses is an inverse problem for characterization techniques, which benefit from an inherent redundancy in the measurement. Conventionally, time-consuming optimization algorithms are used to solve the inverse problems. Here, we demonstrate the reconstruction of ultrashort pulses from dispersion scan traces employing a deep neural network. The network is trained with a multitude of artificial and noisy dispersion scan traces from randomly shaped pulses. The retrieval takes only 16 ms enabling video-rate reconstructions. This approach reveals a great tolerance against noisy conditions, delivering reliable retrievals from traces with signal-to-noise ratios down to 5.