1.
Nano Lett
; 13(9): 4217-23, 2013 Sep 11.
Artículo
en Inglés
| MEDLINE
| ID: mdl-23941358
RESUMEN
We show that inspection with an optical microscope allows surprisingly simple and accurate identification of single and multilayer graphene domains in epitaxial graphene on silicon carbide (SiC/G) and is informative about nanoscopic details of the SiC topography, making it ideal for rapid and noninvasive quality control of as-grown SiC/G. As an illustration of the power of the method, we apply it to demonstrate the correlations between graphene morphology and its electronic properties by quantum magneto-transport.