Trimodal imaging system capable of quantitative phase imaging without 2 pi ambiguities.

A neoteric approach to interferometric phase imaging unencumbered by 2 pi phase ambiguities is presented. This technique utilizes an actively controlled angular displacement glass plate positioned in the reference arm of an environmentally stabilized pseudoheterodyne Mach-Zehnder interferometer. The plate is continually adjusted to maintain a constant interferometric output phase, as a phase object in the sample arm is raster scanned. Using a 632.8 nm source, unwrapped phase images of translucent samples ranging from approximately 150 nm to 1.5 microm thick were obtained. This system is incorporated into a conventional near-field scanning optical microscope, which permits simultaneous phase, intensity, and surface morphology studies.