Experimental setup for thermal measurements at the nanoscale using a SThM probe with niobium nitride thermometer.

Scanning Thermal Microscopy (SThM) has become an important measurement technique for characterizing the thermal properties of materials at the nanometer scale. This technique requires a SThM probe that combines an Atomic Force Microscopy (AFM) probe and a very sensitive resistive thermometer; the thermometer being located at the apex of the probe tip allows for the mapping of temperature or thermal properties of nanostructured materials with very high spatial resolution. The high interest of the SThM technique in the field of thermal nanoscience currently suffers from a low temperature sensitivity despite its high spatial resolution. To address this challenge, we developed a high vacuum-based AFM system hosting a highly sensitive niobium nitride (NbN) SThM probe to demonstrate its unique performance. As a proof of concept, we utilized this custom-built system to carry out thermal measurements using the 3ω method. By measuring the V3ω voltage on the NbN resistive thermometer under vacuum conditions, we were able to determine the SThM probe's thermal conductance and thermal time constant. The performance of the probe is demonstrated by performing thermal measurements in-contact with a sapphire sample.

Probing the light hole/heavy hole switching with correlated magneto-optical spectroscopy and chemical analysis on a single quantum dot.

A whole series of complementary studies have been performed on the same single nanowire containing a quantum dot: cathodoluminescence spectroscopy and imaging, micro-photoluminescence spectroscopy under magnetic field and as a function of temperature, and energy-dispersive x-ray spectrometry and imaging. The ZnTe nanowire was deposited on a Si3N4 membrane with Ti/Al patterns. The complete set of data shows that the CdTe quantum dot features the heavy-hole state as a ground state, although the compressive mismatch strain promotes a light-hole ground state as soon as the aspect ratio is larger than unity (elongated dot). A numerical calculation of the whole structure shows that the transition from the heavy-hole to the light-hole configuration is pushed toward values of the aspect ratio much larger than unity by the presence of a (Zn, Mg)Te shell, and that the effect is further enhanced by a small valence band offset between the semiconductors in the dot and around it.

Near-field optical imaging with a CdSe single nanocrystal-based active tip.

We report near-field scanning optical imaging with an active tip made of a single fluorescent CdSe nanocrystal attached at the apex of an optical tip. Although the images are acquired only partially because of the random blinking of the semiconductor particle, our work validates the use of such tips in ultra-high spatial resolution optical microscopy.

Low-temperature near-field spectroscopy of CdTe quantum dots.

A near-field optical microscope has been developed for operation at low temperature. This microscope is used to study the photoluminescence of CdTe-based quantum dots. Spectra collected upon approaching the optical tip into the near-field region of the sample reveal the evolution from a broad far-field luminescence band - that is typical for a large ensemble of dots - to a near-field structure made up of a few sharp peaks originating from individual dots. Experiments carried out in the excitation-collection mode through the optical tip allow study of the effect of an increase in excitation power on the near-field spectra. It is found that upon increasing the excitation by two orders of magnitude, a spatially resolved spectrum progressively transforms back into a broad 'far-field-like' spectrum. Photoluminescence images taken by scanning the sample under the tip are used to discriminate various contributions coming from individual dots.