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1.
Opt Express ; 27(6): 9097-9098, 2019 03 18.
Artículo en Inglés | MEDLINE | ID: mdl-31052719

RESUMEN

Erroneous absolute luminance values of the pixelated phosphor structure B25 (pixel size of 25 microns by 25 microns) have been corrected. The updated figure shows clearly the potential of the investigated structure as light-converter for high-resolution lighting systems.

2.
Opt Express ; 26(20): 26134-26144, 2018 Oct 01.
Artículo en Inglés | MEDLINE | ID: mdl-30469704

RESUMEN

Porous phosphor microstructures are studied for their potential as light converter in laser-based, high-resolution lighting systems. Phosphor particles are filled into pre-patterned silicon molds and coated by an atomic layer deposition with a thin layer of Al2O3 for mechanical stability. Pixel sizes of 2 mm by 2 mm down to 25 µm by 25 µm are fabricated. The structures show a significant drop in luminance between the illuminated and the non-illuminated, adjacent pixel. The high thermal conductivity of the silicon allows an efficient cooling of the structures. Having removed the backside silicon, an active air flow cooling of the porous phosphor structure is possible.

3.
Opt Express ; 21(2): 1741-50, 2013 Jan 28.
Artículo en Inglés | MEDLINE | ID: mdl-23389158

RESUMEN

In this work the design of Si / hybrid waveguides which contain a vertical infiltrated slot is studied. The case of slots infiltrated with a χ³ nonlinear material of relatively high refractive index (e.g. chalcogenide glasses) is specifically discussed. An optimized waveguide geometry with periodic refractive index modulation, a nonlinear figure of merit > 1 and minimum effective mode cross section is presented. Introducing a periodic refractive index variation along the waveguide allows the adjustment of the group velocity dispersion (GVD). Choosing the period accordingly, the phase matching condition for degenerate four wave mixing (GVD = 0) can be fulfilled at virtually any desired frequency and independently from the fixed optimized waveguide cross section.


Asunto(s)
Refractometría/instrumentación , Silicio/química , Resonancia por Plasmón de Superficie/instrumentación , Resonancia por Plasmón de Superficie/métodos , Diseño Asistido por Computadora , Diseño de Equipo , Análisis de Falla de Equipo , Luz , Dispersión de Radiación
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