RESUMEN
Interactions of living cells with cold plasma of electrical discharges affect cell physiology, often resulting in the loss of viability. However, the mechanisms involved in cell killing are poorly understood, and dissection of cellular pathways or structures affected by plasma using simple eukaryotic models is needed. Using selected genetic mutants of yeast (Saccharomyces cerevisiae), we investigated the role of oxidative stress and yeast apoptosis in plasma-induced cell killing. Increased sensitivity of yeast strains deficient in superoxide dismutases indicated that reactive oxygen species generated in the plasma are among the most prominent factors involved in killing of yeast cells. In mutant strains with a deletion of the key components of yeast apoptotic pathway, the sensitivity of cells towards the plasma treatment remained unaffected. Yeast apoptosis, thus, does not appear to play a significant role in plasma-induced cell killing of yeast.