Research on the beam structures observed from X-ray optics in the far field.

For advanced X-ray sources such as synchrotron radiation facilities and X-ray free electron lasers, a smooth, structure-free beam on the far-field plane is usually strongly desired. The formation of the fine structures in far-field images downstream from imperfect optics must be understood. Although numerous studies have discussed the impacts on focused beams, there are still few quantitative theories for the impacts on beams in the far field. This article is an advance on our previous work, which discussed the uniformity of the intensity distribution in the far field. Here, a new theoretical approach is presented. It not only eases the assumptions needed to relate the fine structures to the wavefront curvature, but it also provides a quantitative estimation of the impacts of optical errors. The theoretical result is also verified by X-ray experiments.

Calculating temperature-dependent X-ray structure factors of α-quartz with an extensible Python 3 package.

The design of X-ray optics based on diffraction from crystals depends on the accurate calculation of the structure factors of their Bragg reflections over a wide range of temperatures. In general, the temperature dependence of the lattice parameters, the atomic positions and the atomic thermal vibrations is both anisotropic and nonlinear. Implemented here is a software package for precise and flexible calculation of structure factors for dynamical diffraction. α-Quartz is used as an example because it presents the challenges mentioned above and because it is being considered for use in high-resolution X-ray spectroscopy. The package is designed to be extended easily to other crystals by adding new material files, which are kept separate from the package's stable core. Python 3 was chosen as the language to allow the easy integration of this code into existing packages. The importance of a correct anisotropic treatment of the atomic thermal vibrations is demonstrated by comparison with an isotropic Debye model. Discrepancies between the two models can be as much as 5% for strong reflections and considerably larger (even to the level of 100%) for weak reflections. A script for finding Bragg reflections that backscatter X-rays of a given energy within a given temperature range is demonstrated. The package and example scripts are available on request. Also discussed, in detail, are the various conventions related to the proper description of chiral quartz.

Extending synchrotron SAXS instrument ranges through addition of a portable, inexpensive USAXS module with vertical rotation axes.

Ultra-SAXS can enhance the capabilities of existing synchrotron SAXS/WAXS beamlines. A compact ultra-SAXS module has been developed, which extends the measurable q-range with 0.0015 ≤ q (nm-1) ≤ 0.2, allowing structural dimensions in the range 30 ≤ D (nm) ≤ 4000 to be probed in addition to the range covered by a high-end SAXS/WAXS instrument. By shifting the module components in and out on their respective motor stages, SAXS/WAXS measurements can be easily and rapidly interleaved with USAXS measurements. The use of vertical crystal rotation axes (horizontal diffraction) greatly simplifies the construction, at minimal cost to efficiency. In this paper, the design considerations, realization and synchrotron findings are presented. Measurements of silica spheres, an alumina membrane, and a porous carbon catalyst are provided as application examples.

Investigation of the stripe patterns from X-ray reflection optics.

X-ray beams reflected from a single layer or multilayer coating are widely used for X-ray tomography, holography, and X-ray phase contrast imaging. However, the observed irregular stripe patterns from either unfocused or defocused beams often cause disturbing artifacts and seriously deteriorate the image quality. In this work, we investigate the origin of these irregular fine structures using the wave optics theory. The connection to similar results obtained by the geometric optics theory is also presented. The proposed relation between the second derivative of the wavefront and the irregular structures was then verified by conducting at-wavelength metrology with the speckle-based wavefront sensing technique. This work will not only help to understand the formation of these irregular structures but also provide the basis for manufacturing future 'stripe-free' refection optics.

Fast convolution-based performance estimation method for diffraction-limited source with imperfect X-ray optics.

Although optical element error analysis is always an important part of beamline design for highly coherent synchrotron radiation or free-electron laser sources, the usual wave optics simulation can be very time-consuming, which limits its application at the early stage of the beamline design. In this work, a new theoretical approach has been proposed for quick evaluations of the optical performance degradation due to optical element error. In this way, time-consuming detailed simulations can be applied only when truly necessary. This approach treats the imperfections as perturbations that convolve with the ideal performance. For simplicity, but not by necessity, the Gaussian Schell-model has been used to show the application of this theoretical approach. The influences of the finite aperture size and height error of a focusing mirror are analysed using the proposed theory. The physical explanation of the performance degradation acquired from the presented approach helps to give a better definition of the critical range of error spatial frequencies that most affect the performance of a mirror. An example comparing two mirror surface errors with identical power spectral density functions is given. These two types of mirror surface errors result in very different intensity profiles. The approach presented in this work could help beamline designers specify the error tolerances on general optical elements more accurately.

Beamline B21: high-throughput small-angle X-ray scattering at Diamond Light Source.

B21 is a small-angle X-ray scattering (SAXS) beamline with a bending magnet source in the 3 GeV storage ring at the Diamond Light Source Ltd synchrotron in the UK. The beamline utilizes a double multi-layer monochromator and a toroidal focusing optic to deliver 2 × 1012 photons per second to a 34 × 40 µm (FWHM) focal spot at the in-vacuum Eiger 4M (Dectris) detector. A high-performance liquid chromatography system and a liquid-handling robot make it possible to load solution samples into a temperature-controlled in-vacuum sample cell with a high level of automation. Alternatively, a range of viscous or solid materials may be loaded manually using a range of custom sample cells. A default scattering vector range from 0.0026 to 0.34 Å-1 and low instrument background make B21 convenient for measuring a wide range of biological macromolecules. The beamline has run a full user programme since 2013.

1 m long multilayer-coated deformable piezoelectric bimorph mirror for adjustable focusing of high-energy X-rays.

The Diamond Light Source (DLS) beamline I15-1 measures atomic pair distribution functions (PDF) using scattering of 40-80 keV X-rays. A unique focusing element was needed to condense these X-rays from an initial large cross section (11.0 mm H × 4.2 mm V) into a required spot size of FWHM ≈680 µm (H) × 20 µm (V) at a variable position between the sample and the detector. The large numerical aperture is achieved by coating a silicon substrate over 1 m long with three multilayer stripes of Bragg angle 4.2 mrad. One stripe selects X-rays of each energy 40.0, 65.4, and 76.6 keV. Sixteen piezoelectric bimorph actuators attached to the sides of the mirror substrate adjusted the reflecting surface's shape. Focal spots of vertical width < 15 µm were obtained at three positions over a 0.92 m range, with fast, easy switching from one focal position to another. Minimized root mean square slope errors were close to 0.5 µrad after subtraction of a uniform curvature. Reflectivity curves taken along each stripe showed consistent high peaks with generally small angular variation of peak positions. This is the first application of a 1 m long multilayer-coated bimorph mirror at a synchrotron beamline. Data collected with its help on a slice of a lithium ion battery's cathode are presented.

Dynamic adaptive X-ray optics. Part II. High-speed piezoelectric bimorph deformable Kirkpatrick-Baez mirrors for rapid variation of the 2D size and shape of X-ray beams.

The tangential curvature of actively bent X-ray mirrors at synchrotron radiation and X-ray free-electron laser (XFEL) facilities is typically only changed every few hours or even days. This operation can take tens of minutes for active optics with multiple bending actuators and often requires expert guidance using in situ monitoring devices. Hence, the dynamic performance of active X-ray optics for synchrotron beamlines has historically not been exploited. This is in stark contrast to many other scientific fields. However, many areas of synchrotron radiation and XFEL science, including macromolecular crystallography, could greatly benefit from the ability to change the size and shape of the X-ray beam rapidly and continuously. The advantages of this innovative approach are twofold: a large reduction in the dead time required to change the size of the X-ray beam for different-sized samples and the possibility of making multiple changes to the beam during the measurement of a single sample. In the preceding paper [Part I; Alcock, Nistea, Signorato & Sawhney (2019), J. Synchrotron Rad. 26, 36-44], which accompanies this article, high-speed visible-light Fizeau interferometry was used to identify the factors which influence the dynamic bending behaviour of piezoelectric bimorph deformable X-ray mirrors. Building upon this ex situ metrology study, provided here is the first synchrotron radiation beamline implementation of high-speed adaptive X-ray optics using two bimorphs operating as a Kirkpatrick-Baez pair. With optimized substrates, novel opto-mechanical holders and a next-generation high-voltage power supply, the size of an X-ray beam was rapidly and repeatedly switched in <10 s. Of equal importance, it is also shown that compensation of piezoelectric creep ensures that the X-ray beam size remains stable for more than 1 h after making a major change. The era of high-speed adaptive X-ray optics for synchrotron radiation and XFEL beamlines has begun.

The scanning four-bounce monochromator for beamline I20 at the Diamond Light Source.

A description of the technical and design details of a scanning four-bounce crystal monochromator that has recently been commissioned for the Versatile X-ray Absorption Spectroscopy (XAS) beamline at Diamond Light Source is presented. This device consists of two independent rotary axes of unique design which are synchronized using a multiple read-head encoder system. This monochromator is shown to be capable of maintaining the flux throughput of the Bragg axes without the need of any external feedback mechanism from 4 to 20 keV. The monochromator is currently equipped with cryogenically cooled crystals with the upstream axis consisting of two independent Si(111) crystals and a pair of channel-cut crystals in the downstream axis. The possibility of installing an additional Si(311) crystal-set to extend the energy range to 34 keV is incorporated into the preliminary design of the device. Experimental data are presented showing the exceptional mechanical stability and repeatability of the monochromator axes.

Aberration-free aspherical lens shape for shortening the focal distance of an already convergent beam.

The shapes of single lens surfaces capable of focusing divergent and collimated beams without aberration have already been calculated. However, nanofocusing compound refractive lenses (CRLs) require many consecutive lens surfaces. Here a theoretical example of an X-ray nanofocusing CRL with 48 consecutive surfaces is studied. The surfaces on the downstream end of this CRL accept X-rays that are already converging toward a focus, and refract them toward a new focal point that is closer to the surface. This case, so far missing from the literature, is treated here. The ideal surface for aberration-free focusing of a convergent incident beam is found by analytical computation and by ray tracing to be one sheet of a Cartesian oval. An `X-ray approximation' of the Cartesian oval is worked out for the case of small change in index of refraction across the lens surface. The paraxial approximation of this surface is described. These results will assist the development of large-aperture CRLs for nanofocusing.

Creating flat-top X-ray beams by applying surface profiles of alternating curvature to deformable piezo bimorph mirrors.

Beam shaping is becoming increasingly important for synchrotron X-ray applications. Although routine for visible light lasers, this is challenging for X-rays due to the limited source coherence and extreme optical tolerances required for the shaping mirrors. In deliberate defocusing, even surface errors <5 nm r.m.s. introduce damagingly large striations into the reflected beam. To counteract such problems, surface modifications with alternating concave and convex curvature on equal segments were polished onto the surface of non-active mirrors of fixed curvature. Such optics are useful for providing a fixed size of X-ray beam, but do not provide the adaptability required by many experiments. In contrast, deformable piezo bimorph mirrors permit a continuous range of X-ray beam sizes and shapes. A new theory is developed for applying non-periodic modifications of alternating curvature to optical surfaces. The position and length of the segments may be freely chosen. For the first time, surface modifications of alternating curvature are applied to bimorph mirrors to generate non-Gaussian X-ray beam profiles of specified width. The new theory's freedom is exploited to choose the segments to match the polishing errors of medium wavelength (>10 mm) and the piezos' influence on the mirror's figure. Five- and seven-segment modifications of alternating curvature are calculated and verified by visible light and X-ray metrology. The latter yields beam profiles with less striation than those made by defocusing. Remaining beam striations are explained by applying geometrical optics to the deviations from the ideal surface modifications of alternating curvature.

Rotation of X-ray polarization in the glitches of a silicon crystal monochromator.

EXAFS studies on dilute samples are usually carried out by collecting the fluorescence yield using a large-area multi-element detector. This method is susceptible to the 'glitches' produced by all single-crystal monochromators. Glitches are sharp dips or spikes in the diffracted intensity at specific crystal orientations. If incorrectly compensated, they degrade the spectroscopic data. Normalization of the fluorescence signal by the incident flux alone is sometimes insufficient to compensate for the glitches. Measurements performed at the state-of-the-art wiggler beamline I20-scanning at Diamond Light Source have shown that the glitches alter the spatial distribution of the sample's quasi-elastic X-ray scattering. Because glitches result from additional Bragg reflections, multiple-beam dynamical diffraction theory is necessary to understand their effects. Here, the glitches of the Si(111) four-bounce monochromator of I20-scanning just above the Ni K edge are associated with their Bragg reflections. A fitting procedure that treats coherent and Compton scattering is developed and applied to a sample of an extremely dilute (100 micromolal) aqueous solution of Ni(NO3)2. The depolarization of the wiggler X-ray beam out of the electron orbit is modeled. The fits achieve good agreement with the sample's quasi-elastic scattering with just a few parameters. The X-ray polarization is rotated up to ±4.3° within the glitches, as predicted by dynamical diffraction. These results will help users normalize EXAFS data at glitches.

X-ray Birefringence Imaging of Materials with Anisotropic Molecular Dynamics.

The X-ray birefringence imaging (XBI) technique, reported very recently, is a sensitive tool for spatially resolved mapping of the local orientational properties of anisotropic materials. In this paper, we report the first XBI measurements on materials that undergo anisotropic molecular dynamics. Using incident linearly polarized X-rays with energy close to the Br K-edge, the X-ray birefringence is dictated by the orientational properties of the C-Br bonds in the material. We focus on two materials (urea inclusion compounds containing 1,8-dibromooctane and 1,10-dibromodecane guest molecules) for which the reorientational dynamics of the brominated guest molecules (and hence the reorientational dynamics of the C-Br bonds) are already well characterized by other experimental techniques. The XBI results demonstrate clearly that, for the anisotropic molecular dynamics in these materials, the effective X-ray optic axis for the X-ray birefringence phenomenon is the time-averaged resultant of the orientational distribution of the C-Br bonds.

Characterization of a next-generation piezo bimorph X-ray mirror for synchrotron beamlines.

Piezo bimorph mirrors are versatile active optics used on many synchrotron beamlines. However, many bimorphs suffer from the `junction effect': a periodic deformation of the optical surface which causes major aberrations to the reflected X-ray beam. This effect is linked to the construction of such mirrors, where piezo ceramics are glued directly below the thin optical substrate. In order to address this problem, a next-generation bimorph with piezos bonded to the side faces of a monolithic substrate was developed at Thales-SESO and optimized at Diamond Light Source. Using metrology feedback from the Diamond-NOM, the optical slope error was reduced to ∼ 0.5 µrad r.m.s. for a range of ellipses. To maximize usability, a novel holder was built to accommodate the substrate in any orientation. When replacing a first-generation bimorph on a synchrotron beamline, the new mirror significantly improved the size and shape of the reflected X-ray beam. Most importantly, there was no evidence of the junction effect even after eight months of continuous beamline usage. It is hoped that this new design will reinvigorate the use of active bimorph optics at synchrotron and free-electron laser facilities to manipulate and correct X-ray wavefronts.

Obtaining local reciprocal lattice vectors from finite-element analysis.

Finite-element analysis is frequently used by engineers at synchrotron beamlines to calculate the elastic deformation of a single crystal undergoing mechanical bending or thermal load. ANSYS Workbench software is widely used for such simulations. However, although ANSYS Workbench software provides useful information on the displacements, strains and stresses within the crystal, it does not yield the local reciprocal lattice vectors that would be required for X-ray diffraction calculations. To bridge this gap, a method based on the shape functions and interpolation procedures of the software itself has been developed. An application to the double-crystal bent Laue monochromator being designed for the I12 (JEEP) wiggler beamline at the Diamond Light Source is presented.

Nearly perfect large-area quartz: 4 meV resolution for 10 keV photons over 10 cm(2).

The perfection of two commercial top-grade quartz crystal wafers has been investigated using Bragg reflection at theta(B)=89.77 degrees of a 2.0 meV bandwidth beam of 9.979 keV X-rays by the (7\bar4\bar34) lattice planes. Topographic images show small defect concentrations (

An X-ray BBB Michelson interferometer.

A new X-ray Michelson interferometer based on the BBB interferometer of Bonse and Hart and designed for X-rays of wavelength approximately 1 A was described in a previous paper. Here, a further test carried out at the SPring-8 1 km beamline BL29XUL is reported. One of the BBB's mirrors was displaced by a piezo to introduce the required path-length difference. The resulting variation of intensity with piezo voltage as measured by an avalanche photodiode could be ascribed to the phase variation resulting from the path-length change, with a small additional contribution from the change of the position of the lattice planes of the front mirror relative to the rest of the crystal. This 'Michelson fringe' interpretation is supported by the observed steady movement across the output beam of the interference fringes produced by a refractive wedge when the piezo voltage was ramped. The front-mirror displacement required for one complete fringe at the given wavelength is only 0.675 A; therefore, a quiet environment is vital for operating this device, as previous experiments have shown.