RESUMEN
Plastic materials are ubiquitous and raise concerns about their impact on health and the environment. To address these concerns, it is crucial to characterize the structural, size, and textural properties of plastics throughout their lifecycle from production to degradation. Raman spectroscopy appears as a valuable tool for this purpose, offering speed, robustness, and sensitivity to nanoscale and amorphous particles. In order to be properly used for plastics, the Raman response of reference materials needs to be carefully assessed, with the literature on such assessments being scarce. This study addresses this gap by using theoretical calculations to generate ab initio spectra for polystyrene, a reference material. The aim is to explain the origins of the spectral peaks and their consistency across various compositions and structures using linear ordered polymeric and finite amorphous models. The CRYSTAL package is employed to obtain full Raman spectra based on a careful benchmark of computational settings. While some peaks are present across all spectra and can serve for calibration, others exhibit structure-dependent behavior, enabling polymer identification. We conclude that Raman spectroscopy is a well-suited technique for plastics characterization provided that a careful analysis of signal origin is conducted to fully interpret the spectra and deploy applications.
RESUMEN
Titania-based materials are abundant in technological applications, as well as everyday products; however, many of its structure-property relationships are still unclear. In particular, its surface reactivity on the nanoscale has important consequences for fields such as nanotoxicity or (photo)catalysis. Raman spectroscopy has been used to characterize titania-based (nano)material surfaces, mainly based on empirical peak assignments. In the present work, we address the structural features responsible for the Raman spectra of pure, stoichiometric TiO2 materials from a theoretical characterization. We determine a computational protocol to obtain accurate Raman response in a series of anatase TiO2 models, namely, the bulk and three low-index terminations by periodic ab initio approaches. The origin of the Raman peaks is thoroughly analyzed and the structure-Raman mapping is performed to account for structural distortions, laser and temperature effects, surface orientation, and size. We address the appropriateness of previous experimental use of Raman to quantify the presence of distinct TiO2 terminations, and provide guidelines to exploit the Raman spectrum based on accurate rooted calculations that could be used to characterize a variety of titania systems (e.g., single crystals, commercial catalysts, thin layered materials, facetted nanoparticles, etc.).
RESUMEN
Materials science and device studies have, when implemented jointly as "operando" studies, better revealed the causal link between the properties of the device's materials and its operation, with applications ranging from gas sensing to information and energy technologies. Here, as a further step that maximizes this causal link, the paper focuses on the electronic properties of those atoms that drive a device's operation by using it to read out the materials property. It is demonstrated how this method can reveal insight into the operation of a macroscale, industrial-grade microelectronic device on the atomic level. A magnetic tunnel junction's (MTJ's) current, which involves charge transport across different atomic species and interfaces, is measured while these atoms absorb soft X-rays with synchrotron-grade brilliance. X-ray absorption is found to affect magnetotransport when the photon energy and linear polarization are tuned to excite FeO bonds parallel to the MTJ's interfaces. This explicit link between the device's spintronic performance and these FeO bonds, although predicted, challenges conventional wisdom on their detrimental spintronic impact. The technique opens interdisciplinary possibilities to directly probe the role of different atomic species on device operation, and shall considerably simplify the materials science iterations within device research.