Rapid imaging and product screening with low-cost line-field Fourier domain optical coherence tomography.

Fourier domain optical coherence tomography (FD-OCT) is a well-established imaging technique that provides high-resolution internal structure images of an object at a fast speed. Modern FD-OCT systems typically operate at speeds of 40,000-100,000 A-scans/s, but are priced at least tens of thousands of pounds. In this study, we demonstrate a line-field FD-OCT (LF-FD-OCT) system that achieves an OCT imaging speed of 100,000 A-scan/s at a hardware cost of thousands of pounds. We demonstrate the potential of LF-FD-OCT for biomedical and industrial imaging applications such as corneas, 3D printed electronics, and printed circuit boards.

Simultaneous optical coherence tomography and Scheimpflug imaging using the same incident light.

For any single anterior chamber cross-sectional (tomographic) imaging method, there is a practical compromise between image size and image resolution. In order to obtain large field-of-view cross-sectional images of the whole anterior chamber and high-resolution cross-sectional images of the fine corneal layers, measurements by multiple devices are currently required. This paper presents a novel raster scanning tomographic imaging device that acquires simultaneous large field-of-view Scheimpflug (12.5 mm image depth, 50 µm axial resolution in air) and high-resolution spectral domain optical coherence tomography (SD-OCT) (2 mm image depth, 3.7µm axial resolution in air) using the same illuminating photons. For the novel raster scanning 3D Scheimpflug imaging, a tunable lens system together with numerical methods for correcting refraction distortion were used. To demonstrate the capability of simultaneous measurement of both fine corneal layers and whole anterior chambers topology, ex vivo measurements on 12 porcine and 12 bovine eyes were carried out. There is a reasonable agreement in the overall central corneal thicknesses (CCT) obtained from the simultaneous SD-OCT and Scheimpflug measurements. In addition, because the same infrared light beam was used to illuminate the sample, both OCT and Scheimpflug images were taken at the exact same location of a sample simultaneously in a single measurement. This provides a unique method for measuring both the thickness and the refractive index of a sample.