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1.
J Microsc ; 265(3): 307-312, 2017 03.
Article de Anglais | MEDLINE | ID: mdl-28117892

RÉSUMÉ

Focused ion beam (FIB) is an extremely valuable tool in nanopatterning and nanofabrication for potentially high-resolution patterning, especially when refers to He ion beam microscopy. The work presented here demonstrates an 'out-of-the-box' method of writing using FIB, which enables creating very large matrices, up to the beam-shift limitation, in short times and with high accuracy unachievable by any other writing technique. The new method allows combining different shapes in nanometric dimensions and high resolutions for wide ranges.

2.
Nanoscale ; 6(3): 1545-51, 2014.
Article de Anglais | MEDLINE | ID: mdl-24323364

RÉSUMÉ

Here we demonstrate an approach to enhance the growth of vertically aligned carbon nanotubes (CNTs) by including a catalyst reservoir underneath the thin-film alumina catalyst underlayer. This reservoir led to enhanced CNT growth due to the migration of catalytic material from below the underlayer up to the surface through alumina pinholes during processing. This led to the formation of large Fe particles, which in turn influenced the morphology evolution of the catalytic iron surface layer through Ostwald ripening. With inclusion of this catalyst reservoir, we observed CNT growth up to 100% taller than that observed without the catalyst reservoir consistently across a wide range of annealing and growth durations. Imaging studies of catalyst layers both for different annealing times and for different alumina support layer thicknesses demonstrate that the surface exposure of metal from the reservoir leads to an active population of smaller catalyst particles upon annealing as opposed to a bimodal catalyst size distribution that appears without inclusion of a reservoir. Overall, the mechanism for growth enhancement we present here demonstrates a new route to engineering efficient catalyst structures to overcome the limitations of CNT growth processes.

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