RÉSUMÉ
Co/Al2O3/Co magnetic tunnel junctions with an interfacial Cu layer have been investigated with in situ growth characterization and ex situ magnetotransport measurements. Cu interlayers grown on Co give an approximately exponential decay of the tunneling magnetoresistance with xi approximately 0.26 nm while those grown on Al2O3 have a decay length of 0.70 nm. The difference in decay lengths can be explained by different growth morphologies, and in this way clarifies a present disagreement in the literature. For monolayer coverage of Cu, we show that the tunneling spin polarization is suppressed by at least a factor of 2 compared to Co and beyond approximately 5 ML it becomes vanishingly small.
RÉSUMÉ
The thickness and temperature dependences of the interlayer exchange coupling in well-defined molecular beam epitaxy-grown Fe/Si/Fe sandwich structures have been studied. The biquadratic coupling shows a strong temperature dependence in contrast to the bilinear coupling. Both depend exponentially on thickness. These observations can be well understood in the framework of Slonczewski's loose spins model [J. Appl. Phys. 73, 5957 (1993)]. No bilinear contribution of the loose spins to the coupling was observed.