RÉSUMÉ
A new method for the determination of the absolute brightness of pointlike soft-x-ray sources is proposed, and an example of its application is shown at a laser-plasma source for a wavelength band from 0.8 to ~ 1.7nm.
RÉSUMÉ
The structure of Ni-C multilayer and single nickel layer samples has been analyzed before and after annealing, using two techniques: fluorescence EXAFS (F1EXAFS) at the Ni-K. edge and CuKα reflection. Annealing at a temperature of 450°C resulted in a change in the structure of the nickel layers from amorphous like to crystalline like. A reduction of the Bragg reflectivity by a factor of 7 was also found. Comparison between the EXAFS data of the annealed sample and of a nickel foil show a difference in the amplitude of the EXAFS. This is ascribed to a non-Gaussian atomic distribution of the backscattering atoms in the annealed sample around their average positions, whereas the atomic distribution in the (polycrystalline) Ni foil is a Gaussian one. From the annealing experiments we conclude that no irreversible changes take place in the structure of the nickel layers at temperatures below 200°C.
RÉSUMÉ
Soft x-ray emission spectra (250-875 eV) are presented for plasmas, produced by picosecond and nanosecond frequency-doubled Nd:YAG-glass laser pulses incident on 14 different target materials. The emitted spectra have been corrected for various apparatus functions which enables a direct comparison between plasmas produced by pico- and nanosecond laser pulses. The relative integrated emission intensity as a function of Z number, obtained from the corrected spectra, shows an oscillatory behavior, with distinct maxima for those elements exhibiting a dominant line emission in our photon energy window. We found for our two pulse lengths an approximately equal conversion efficiency from laser light into x-ray photons. General suggestions are given as to what target material should be used for different applications using the laser plasma as x-ray source in the energy range Studied.