ABSTRACT
It has long been known that the lifetimes of superconducting qubits suffer during readout, increasing readout errors. We show that this degradation is due to the anti-Zeno effect, as readout-induced dephasing broadens the qubit so that it overlaps "hot spots" of strong dissipation, likely due to two-level systems in the qubit's bath. Using a flux-tunable qubit to probe the qubit's frequency-dependent loss, we accurately predict the change in lifetime during readout with a new self-consistent master equation that incorporates the modification to qubit relaxation due to measurement-induced dephasing. Moreover, we controllably demonstrate both the Zeno and anti-Zeno effects, which can explain both suppression and the rarer enhancement of qubit lifetimes during readout.
ABSTRACT
Quantum error correction offers a promising path for performing high fidelity quantum computations. Although fully fault-tolerant executions of algorithms remain unrealized, recent improvements in control electronics and quantum hardware enable increasingly advanced demonstrations of the necessary operations for error correction. Here, we perform quantum error correction on superconducting qubits connected in a heavy-hexagon lattice. We encode a logical qubit with distance three and perform several rounds of fault-tolerant syndrome measurements that allow for the correction of any single fault in the circuitry. Using real-time feedback, we reset syndrome and flag qubits conditionally after each syndrome extraction cycle. We report decoder dependent logical error, with average logical error per syndrome measurement in Z(X)-basis of ~0.040 (~0.088) and ~0.037 (~0.087) for matching and maximum likelihood decoders, respectively, on leakage post-selected data.