Palimpsest memories stored in memristive synapses.

Biological synapses store multiple memories on top of each other in a palimpsest fashion and at different time scales. Palimpsest consolidation is facilitated by the interaction of hidden biochemical processes governing synaptic efficacy during varying lifetimes. This arrangement allows idle memories to be temporarily overwritten without being forgotten, while previously unseen memories are used in the short term. While embedded artificial intelligence can greatly benefit from this functionality, a practical demonstration in hardware is missing. Here, we show how the intrinsic properties of metal-oxide volatile memristors emulate the processes supporting biological palimpsest consolidation. Our memristive synapses exhibit an expanded doubled capacity and protect a consolidated memory while up to hundreds of uncorrelated short-term memories temporarily overwrite it, without requiring specialized instructions. We further demonstrate this technology in the context of visual working memory. This showcases how emerging memory technologies can efficiently expand the capabilities of artificial intelligence hardware toward more generalized learning memories.

Selectively biased tri-terminal vertically-integrated memristor configuration.

Memristors, when utilized as electronic components in circuits, can offer opportunities for the implementation of novel reconfigurable electronics. While they have been used in large arrays, studies in ensembles of devices are comparatively limited. Here we propose a vertically stacked memristor configuration with a shared middle electrode. We study the compound resistive states presented by the combined in-series devices and we alter them either by controlling each device separately, or by altering the full configuration, which depends on selective usage of the middle floating electrode. The shared middle electrode enables a rare look into the combined system, which is not normally available in vertically stacked devices. In the course of this study, it was found that separate switching of individual devices carries over its effects to the Complete device (albeit non-linearly), enabling increased resistive state range, which leads to a larger number of distinguishable states (above SNR variance limits) and hence enhanced device memory. Additionally, by applying a switching stimulus to the external electrodes it is possible to switch both devices simultaneously, making the entire configuration a voltage divider with individual memristive components. Through usage of this type of configuration and by taking advantage of the voltage division, it is possible to surge-protect fragile devices, while it was also found that simultaneous reset of stacked devices is possible, significantly reducing the required reset time in larger arrays.

Technology agnostic frequency characterization methodology for memristors.

Over the past decade, memristors have been extensively studied for a number of applications, almost exclusively with DC characterization techniques. Studies of memristors in AC circuits are sparse, with only a few examples found in the literature, and characterization methods with an AC input are also sparingly used. However, publications concerning the usage of memristors in this working regime are currently on the rise. Here we propose a "technology agnostic" methodology for memristor testing in certain frequency bands. A measurement process is initially proposed, with specific instructions on sample preparation, followed by an equipment calibration and measurement protocol. This article is structured in a way which aims to facilitate the usage of any available measurement equipment and it can be applied on any type of memristive technology. The second half of this work is centered around the representation of data received from following this process. Bode plot and Nyquist plot representations are considered and the information received from them is evaluated. Finally, examples of expected behaviors are given, characterizing simulated scenarios which represent different internal device models and different switching behaviors, such as capacitive or inductive switching. This study aims at providing a cohesive way for memristor characterization, to be used as a good starting point for frequency applications, and for understanding physical processes inside the devices, by streamlining the measuring process and providing a frame in which data representation and comparison will be facilitated.