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1.
Nanotechnology ; 28(25): 255301, 2017 Jun 23.
Artigo em Inglês | MEDLINE | ID: mdl-28548051

RESUMO

Focused ion beam (FIB) systems have become powerful diagnostic and modification tools for nanoscience and nanotechnology. Gas field ion sources (GFISs) built from atomic-size emitters offer the highest brightness among all ion sources and thus can improve the spatial resolution of FIB systems. Here we show that the Ir/W(111) single-atom tip (SAT) can emit high-brightness Xe+ ion beams with a high current stability. The ion emission current versus extraction voltage was analyzed from 150 K up to 309 K. The optimal emitter temperature for maximum Xe+ ion emission was ∼150 K and the reduced brightness at the Xe gas pressure of 1 × 10-4 torr is two to three orders of magnitude higher than that of a Ga liquid metal ion source, and four to five orders of magnitude higher than that of a Xe inductively coupled plasma ion source. Most surprisingly, the SAT emitter remained stable even when operated at 309 K. Even though the ion current decreased with increasing temperature, the current at room temperature (RT) could still reach over 1 pA when the gas pressure was higher than 1 × 10-3 torr, indicating the feasibility of RT-Xe-GFIS for application to FIB systems. The operation temperature of Xe-SAT-GFIS is considerably higher than the cryogenic temperature required for the helium ion microscope (HIM), which offers great technical advantages because only simple or no cooling schemes can be adopted. Thus, Xe-GFIS-FIB would be easy to implement and may become a powerful tool for nanoscale milling and secondary ion mass spectroscopy.

2.
Nat Commun ; 8: 14440, 2017 02 14.
Artigo em Inglês | MEDLINE | ID: mdl-28195123

RESUMO

There are only a handful of scanning techniques that can provide surface topography at nanometre resolution. At the same time, there are no methods that are capable of non-invasive imaging of the three-dimensional surface topography of a thin free-standing crystalline material. Here we propose a new technique-the divergent beam electron diffraction (DBED) and show that it can directly image the inhomogeneity in the atomic positions in a crystal. Such inhomogeneities are directly transformed into the intensity contrast in the first-order diffraction spots of DBED patterns and the intensity contrast linearly depends on the wavelength of the employed probing electrons. Three-dimensional displacement of atoms as small as 1 angstrom can be detected when imaged with low-energy electrons (50-250 eV). The main advantage of DBED is that it allows visualization of the three-dimensional surface topography and strain distribution at the nanometre scale in non-scanning mode, from a single shot diffraction experiment.

3.
Rev Sci Instrum ; 83(8): 083704, 2012 Aug.
Artigo em Inglês | MEDLINE | ID: mdl-22938300

RESUMO

We demonstrate a new and simple process to fabricate tungsten tips with good control of the tip profile. In this process, we use a commercial function generator without any electronic cutoff circuit or complex mechanical setup. The tip length can be varied from 160 µm to 10 mm, corresponding to an aspect ratio of 1.6-100. The radius of curvature of the tip apex can be controlled to a size <10 nm. Surface roughness and the taper angle can be controlled independently. Through control of the etching parameters, the tip length, the radius of curvature, surface roughness, and the taper angle can be controlled to suit different requirements of various applications. The possible etching mechanisms are also discussed.

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