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Imaging of electrically detected magnetic resonance of a silicon wafer.
Sato, T; Yokoyama, H; Ohya, H; Kamada, H.
Affiliation
  • Sato T; Yamagata Research Institute of Technology, Yamagata 990-2473, Japan.
J Magn Reson ; 153(1): 113-6, 2001 Nov.
Article in En | MEDLINE | ID: mdl-11700087
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Collection: 01-internacional Database: MEDLINE Language: En Journal: J Magn Reson Journal subject: DIAGNOSTICO POR IMAGEM Year: 2001 Document type: Article Affiliation country:
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PubMed Links

Collection: 01-internacional Database: MEDLINE Language: En Journal: J Magn Reson Journal subject: DIAGNOSTICO POR IMAGEM Year: 2001 Document type: Article Affiliation country: