A comparison of conventional Everhart-Thornley style and in-lens secondary electron detectors: a further variable in scanning electron microscopy.
Scanning
; 33(3): 162-73, 2011.
Article
in En
| MEDLINE
| ID: mdl-21695706
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Scanning
Year:
2011
Document type:
Article