Electronic origin of ultrafast photoinduced strain in BiFeO3. | Phys Rev Lett;110(3): 037601, 2013 Jan 18. | MEDLINE

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Electronic origin of ultrafast photoinduced strain in BiFeO3.

Wen, Haidan; Chen, Pice; Cosgriff, Margaret P; Walko, Donald A; Lee, June Hyuk; Adamo, Carolina; Schaller, Richard D; Ihlefeld, Jon F; Dufresne, Eric M; Schlom, Darrell G; Evans, Paul G; Freeland, John W; Li, Yuelin.

Affiliation

Wen H; X-ray Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA.

Phys Rev Lett ; 110(3): 037601, 2013 Jan 18.

Article in En | MEDLINE | ID: mdl-23373952

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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2013 Document type: Article Affiliation country: Country of publication:

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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 2013 Document type: Article Affiliation country: Country of publication: