The Structure and Properties of Amorphous Indium Oxide.
Chem Mater
; 26(18): 5401-5411, 2014 Sep 23.
Article
in En
| MEDLINE
| ID: mdl-25678743
ABSTRACT
A series of In2O3 thin films, ranging from X-ray diffraction amorphous to highly crystalline, were grown on amorphous silica substrates using pulsed laser deposition by varying the film growth temperature. The amorphous-to-crystalline transition and the structure of amorphous In2O3 were investigated by grazing angle X-ray diffraction (GIXRD), Hall transport measurement, high resolution transmission electron microscopy (HRTEM), electron diffraction, extended X-ray absorption fine structure (EXAFS), and ab initio molecular dynamics (MD) liquid-quench simulation. On the basis of excellent agreement between the EXAFS and MD results, a model of the amorphous oxide structure as a network of InO x polyhedra was constructed. Mechanisms for the transport properties observed in the crystalline, amorphous-to-crystalline, and amorphous deposition regions are presented, highlighting a unique structure-property relationship.
Full text:
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Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Chem Mater
Year:
2014
Document type:
Article
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