Titanium Oxide Crystallization and Interface Defect Passivation for High Performance Insulator-Protected Schottky Junction MIS Photoanodes.
ACS Appl Mater Interfaces
; 8(23): 14596-603, 2016 Jun 15.
Article
in En
| MEDLINE
| ID: mdl-27196628
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01-internacional
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MEDLINE
Language:
En
Journal:
ACS Appl Mater Interfaces
Journal subject:
BIOTECNOLOGIA
/
ENGENHARIA BIOMEDICA
Year:
2016
Document type:
Article
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