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Titanium Oxide Crystallization and Interface Defect Passivation for High Performance Insulator-Protected Schottky Junction MIS Photoanodes.
Scheuermann, Andrew G; Lawrence, John P; Meng, Andrew C; Tang, Kechao; Hendricks, Olivia L; Chidsey, Christopher E D; McIntyre, Paul C.
Affiliation
  • Scheuermann AG; Department of Materials Science and Engineering, Stanford University , Stanford, California 94305, United States.
  • Lawrence JP; Department of Materials Science and Engineering, Stanford University , Stanford, California 94305, United States.
  • Meng AC; Department of Materials Science and Engineering, Stanford University , Stanford, California 94305, United States.
  • Tang K; Department of Materials Science and Engineering, Stanford University , Stanford, California 94305, United States.
  • Hendricks OL; Department of Chemistry, Stanford University , Stanford, California 94305, United States.
  • Chidsey CE; Department of Chemistry, Stanford University , Stanford, California 94305, United States.
  • McIntyre PC; Department of Materials Science and Engineering, Stanford University , Stanford, California 94305, United States.
ACS Appl Mater Interfaces ; 8(23): 14596-603, 2016 Jun 15.
Article in En | MEDLINE | ID: mdl-27196628

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Appl Mater Interfaces Journal subject: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Year: 2016 Document type: Article Affiliation country: Country of publication:

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Appl Mater Interfaces Journal subject: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Year: 2016 Document type: Article Affiliation country: Country of publication: