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Author Correction: Ultra-thin high-efficiency mid-infraredtransmissive Huygens meta-optics.
Zhang, Li; Ding, Jun; Zheng, Hanyu; An, Sensong; Lin, Hongtao; Zheng, Bowen; Du, Qingyang; Yin, Gufan; Michon, Jerome; Zhang, Yifei; Fang, Zhuoran; Shalaginov, Mikhail Y; Deng, Longjiang; Gu, Tian; Zhang, Hualiang; Hu, Juejun.
Affiliation
  • Zhang L; State Key Laboratory of Electronic Thin Films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, Sichuan, 611731, China.
  • Ding J; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Zheng H; School of Information and Science Technology, East China Normal University, Shanghai, 200062, China.
  • An S; Department of Electrical & Computer Engineering, University of Massachusetts Lowell, Lowell, MA, 01854, USA.
  • Lin H; State Key Laboratory of Electronic Thin Films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, Sichuan, 611731, China.
  • Zheng B; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Du Q; Department of Electrical & Computer Engineering, University of Massachusetts Lowell, Lowell, MA, 01854, USA.
  • Yin G; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Michon J; Department of Electrical & Computer Engineering, University of Massachusetts Lowell, Lowell, MA, 01854, USA.
  • Zhang Y; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Fang Z; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Shalaginov MY; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Deng L; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Gu T; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Zhang H; Department of Materials Science & Engineering, Massachusetts Institute of Technology, Cambridge, MA, 02139, USA.
  • Hu J; State Key Laboratory of Electronic Thin Films and Integrated Devices, National Engineering Research Center of Electromagnetic Radiation Control Materials, University of Electronic Science and Technology of China, Chengdu, Sichuan, 611731, China.
Nat Commun ; 9(1): 2399, 2018 06 14.
Article in En | MEDLINE | ID: mdl-29904109
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Nat Commun Journal subject: BIOLOGIA / CIENCIA Year: 2018 Document type: Article Affiliation country: Country of publication:
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Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Prognostic_studies Language: En Journal: Nat Commun Journal subject: BIOLOGIA / CIENCIA Year: 2018 Document type: Article Affiliation country: Country of publication: