Fluorescence intensity monitors as intensity and beam-position diagnostics for X-ray free-electron lasers.
J Synchrotron Radiat
; 26(Pt 2): 358-362, 2019 Mar 01.
Article
in En
| MEDLINE
| ID: mdl-30855243
ABSTRACT
For LCLS-II, a fluorescence intensity monitor for the non-invasive, pulse-by-pulse normalization of experiments has been developed. A prototype diagnostic was constructed with a microchannel plate assembly and two photodiodes. The diagnostic was then installed in the LCLS SXR instrument Kirkpatrick-Baez mirror chamber with the detectors located above the vertically reflecting mirror. The linearity, noise and position sensitivity of the detectors have been characterized. The photodiode responsivity is suitable for high pulse energies. The microchannel plate detector shows sufficient responsivity over a wide range of pulse energies. The relative signal from the two photodiodes provides a sensitive measure of the X-ray beam position. The fluorescence intensity monitor provides intensity normalization while being compatible with high incident power, a 0.93â
MHz repetition rate and ultra-high vacuum.
Key words
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Main subject:
Particle Accelerators
/
Fluorescence
/
Lasers
Type of study:
Diagnostic_studies
Language:
En
Journal:
J Synchrotron Radiat
Journal subject:
RADIOLOGIA
Year:
2019
Document type:
Article
Affiliation country: