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Substrate-Selective Morphology of Cesium Iodide Clusters on Graphene.
Vats, Nilesh; Wang, Yi; Sen, Suman; Szilagyi, Sven; Ochner, Hannah; Abb, Sabine; Burghard, Marko; Sigle, Wilfried; Kern, Klaus; van Aken, Peter A; Rauschenbach, Stephan.
Affiliation
  • Vats N; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Wang Y; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Sen S; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Szilagyi S; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Ochner H; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Abb S; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Burghard M; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Sigle W; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • Kern K; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
  • van Aken PA; Institut de Physique de la Matière Condensée, École Polytechnique Fédérale de Lausanne, CH-1015 Lausanne, Switzerland.
  • Rauschenbach S; Max Planck Institute for Solid State Research, Heisenbergstrasse 1, D-70569 Stuttgart, Germany.
ACS Nano ; 14(4): 4626-4635, 2020 Apr 28.
Article in En | MEDLINE | ID: mdl-32283013
ABSTRACT
Formation and characterization of low-dimensional nanostructures is crucial for controlling the properties of two-dimensional (2D) materials such as graphene. Here, we study the structure of low-dimensional adsorbates of cesium iodide (CsI) on free-standing graphene using aberration-corrected transmission electron microscopy at atomic resolution. CsI is deposited onto graphene as charged clusters by electrospray ion-beam deposition. The interaction with the electron beam forms two-dimensional CsI crystals only on bilayer graphene, while CsI clusters consisting of 4, 6, 7, and 8 ions are exclusively observed on single-layer graphene. Chemical characterization by electron energy-loss spectroscopy imaging and precise structural measurements evidence the possible influence of charge transfer on the structure formation of the CsI clusters and layers, leading to different distances of the Cs and I to the graphene.
Key words

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Nano Year: 2020 Document type: Article Affiliation country:

Full text: 1 Collection: 01-internacional Database: MEDLINE Language: En Journal: ACS Nano Year: 2020 Document type: Article Affiliation country: