Your browser doesn't support javascript.
loading
A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing.
Sánchez-Arriaga, Néstor Eduardo; Tiwari, Divya; Hutabarat, Windo; Leyland, Adrian; Tiwari, Ashutosh.
Affiliation
  • Sánchez-Arriaga NE; Amy Johnson Building, Department of Automatic Control and Systems Engineering, University of Sheffield, Portobello St., Sheffield S1 3JD, UK.
  • Tiwari D; Amy Johnson Building, Department of Automatic Control and Systems Engineering, University of Sheffield, Portobello St., Sheffield S1 3JD, UK.
  • Hutabarat W; Amy Johnson Building, Department of Automatic Control and Systems Engineering, University of Sheffield, Portobello St., Sheffield S1 3JD, UK.
  • Leyland A; Sir Robert Hadfield Building, Department of Materials Science and Engineering, University of Sheffield, Mappin St., Sheffield S1 3JD, UK.
  • Tiwari A; Amy Johnson Building, Department of Automatic Control and Systems Engineering, University of Sheffield, Portobello St., Sheffield S1 3JD, UK.
Sensors (Basel) ; 23(11)2023 Jun 04.
Article in En | MEDLINE | ID: mdl-37300053
Key words
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Health_economic_evaluation Language: En Journal: Sensors (Basel) Year: 2023 Document type: Article Affiliation country:
Fulltext
Add to My VHL
Print
XML
PubMed Links
Search on Google

Full text: 1 Collection: 01-internacional Database: MEDLINE Type of study: Health_economic_evaluation Language: En Journal: Sensors (Basel) Year: 2023 Document type: Article Affiliation country: