A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing.
Sensors (Basel)
; 23(11)2023 Jun 04.
Article
in En
| MEDLINE
| ID: mdl-37300053
Full text:
1
Collection:
01-internacional
Database:
MEDLINE
Type of study:
Health_economic_evaluation
Language:
En
Journal:
Sensors (Basel)
Year:
2023
Document type:
Article
Affiliation country: