Multiple-charged secondary-ion emission from silicon and silicon oxide bombarded by heavy ions at energies of 0.4-10 MeV.
Phys Rev A
; 51(1): 554-560, 1995 Jan.
Article
in En
| MEDLINE
| ID: mdl-9911614
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Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Phys Rev A
Year:
1995
Document type:
Article
Country of publication: