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Electron-impact ionization and energy loss of 27-MeV/u Xe35+ incident ions channeled in silicon.
Andriamonje S; Anne R; de Castro Faria NV; Chevallier M; Cohen C; Dural J; Gaillard MJ; Genre R; Hage-Ali M; Kirsch R; L'Hoir A; Farizon-Mazuy B; Mory J; Moulin J; Poizat JC; Quéré Y; Remillieux J; Schmaus D; Toulemonde M.
Phys Rev Lett ; 63(18): 1930-1933, 1989 Oct 30.
Article in En | MEDLINE | ID: mdl-10040717
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 1989 Document type: Article Publication country: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA
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Collection: 01-internacional Database: MEDLINE Language: En Journal: Phys Rev Lett Year: 1989 Document type: Article Publication country: EEUU / ESTADOS UNIDOS / ESTADOS UNIDOS DA AMERICA / EUA / UNITED STATES / UNITED STATES OF AMERICA / US / USA