Electron-impact ionization and energy loss of 27-MeV/u Xe35+ incident ions channeled in silicon.
Phys Rev Lett
; 63(18): 1930-1933, 1989 Oct 30.
Article
in En
| MEDLINE
| ID: mdl-10040717
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Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Phys Rev Lett
Year:
1989
Document type:
Article
Publication country:
EEUU
/
ESTADOS UNIDOS
/
ESTADOS UNIDOS DA AMERICA
/
EUA
/
UNITED STATES
/
UNITED STATES OF AMERICA
/
US
/
USA