Discontinuous change in the smectic layer thickness in ferrielectric liquid crystals.
Phys Rev E Stat Nonlin Soft Matter Phys
; 75(4 Pt 1): 042701, 2007 Apr.
Article
in En
| MEDLINE
| ID: mdl-17500942
ABSTRACT
The temperature dependence of the thickness of thick free-standing films is studied using a high-resolution film thickness measurement technique. A small discontinuity in the temperature dependence of the smectic layer thickness at every phase transition between ferro-, ferri-, and antiferroelectric phases is observed. We show that the major contribution to it arises from a change in the smectic tilt angle.
Search on Google
Collection:
01-internacional
Database:
MEDLINE
Language:
En
Journal:
Phys Rev E Stat Nonlin Soft Matter Phys
Journal subject:
BIOFISICA
/
FISIOLOGIA
Year:
2007
Document type:
Article
Affiliation country:
Irlanda